Zobrazeno 1 - 10
of 21
pro vyhledávání: '"C S, Dulcey"'
Autor:
Guangrui Xia, Ranganathan Shashidhar, Jason D. Slinker, George G. Malliaras, C. S. Dulcey, Randall L. Headrick, M. L. Swiggers, Alon A. Gorodetsky, Brian Weslowski
Publikováno v:
Applied Physics Letters. 79:1300-1302
We have investigated the effect of surface order on the orientation and mobility of pentacene. The surface order was created using monolayers and polymers that are normally used to align liquid crystals. Rubbed polyvinylalcohol layers were found to a
Publikováno v:
The Journal of chemical physics. 120(21)
A prototype case study is presented that examines the level of hydrogen content in H-SWNTs using the Surface Plasmon Resonance technique. The damping effect and the angular shift in the resonance minimum of an SWNT-gold interface due to the presence
Publikováno v:
Chemistry (Weinheim an der Bergstrasse, Germany). 7(20)
We describe and characterize a simple process for the fabrication of patterned materials on polychloromethylstyrene thin film surfaces under ambient conditions. Patterned deep UV exposure (approximately 60 mJcm(-2), 193 nm) efficiently oxidizes the s
Autor:
Jeffrey W. Hudgens, C. S. Dulcey
Publikováno v:
The Journal of Physical Chemistry. 89:1505-1509
Publikováno v:
Chemical Physics Letters. 116:525-528
The thermal decomposition of trimethyl aluminum on different hot substrates has been studied under low-pressure conditions. The products of the decomposition reaction were analyzed mass-spectrometrically using electron-impact and resonance-enhanced m
Publikováno v:
The Journal of Chemical Physics. 87:4546-4558
The reactions of F(2P)+ketene and F(2P)+ketene‐d2 were studied in a flow reactor. Spectra of the radical products CH2F, CD2F, CH, CF, and atomic carbon were detected between 292–395 nm by resonance enhanced multiphoton ionization (REMPI) mass spe
Autor:
C. S. Dulcey, Jeffrey W. Hudgens
Publikováno v:
Chemical Physics Letters. 118:444-447
We report the resonance enhanced multiphoton ionization spectrum of SiF between 430 and 492 nm. SiF radicals absorbed at least three photons to generate the observed m/z 47 SiF ions. Two-photon absorption bands from C″ 2 Σ + ← X 2 Π, and C′ 2
Publikováno v:
Chemical Physics Letters. 131:112-117
Gallium atoms were detected by multiphoton-ionization mass spectrometry in the low-pressure decomposition of trimethylgallium (TMG) on heated substrates (300–1100K). On copper surfaces, an activation energy of 34±3 kcal mol −1 was found for the
Publikováno v:
The Journal of Physical Chemistry. 92:2827-2834
The techniques of laser and electron ionization mass spectrometry have been employed to study the thermal etching of Si(110) by F/sub 2/ and NF/sub 4/ at substrate temperatures between 300 and 1200 K. By two-photon resonance-enhanced ionization of Si
Publikováno v:
Chemical Physics Letters. 115:481-485
The PO radical was detected to desorb from polycrystalline Pt surfaces during the catalytic decomposition of dimethyl methyl phosphonate and trimethyl phosphite above 1100 K using the laser-induced fluorescence technique. The activation energy for th