Zobrazeno 1 - 10
of 36
pro vyhledávání: '"C Martinez Anton"'
Publikováno v:
EP Europace. 24
Funding Acknowledgements Type of funding sources: Public grant(s) – EU funding. Main funding source(s): European Union’s Horizon 2020 research and innovation programme under the Marie Skłodowska-Curie grant agreement No 860974 Regions with patho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d93978623b8fbe11eb9f50c2fc3d788e
https://doi.org/10.1093/europace/euac053.259
https://doi.org/10.1093/europace/euac053.259
Autor:
Daniel Vázquez Moliní, J. C. Martinez-Anton, Ángela Gómez-Manzanares, Santiago Mayorga Pinilla, Antonio Álvarez Fernández-Balbuena
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
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Cultural heritage is a valuable and characteristic symbol of every country. It should be handled with care and it must be exhaustively investigated and measured with non-destructive techniques. In this chapter, we will talk about different reflectanc
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7565f6d7d88144926d7229a83949368
https://mts.intechopen.com/articles/show/title/reflectance-measurements-on-cultural-heritage
https://mts.intechopen.com/articles/show/title/reflectance-measurements-on-cultural-heritage
Autor:
Daniel Vázquez, Jaime Quintana, Luis Prada, J. C. Martinez-Anton, Luis Estrada, Antonio Álvarez Fernández-Balbuena, Javier Alda
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
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The inactivation of pathogens through the irradiation of ultraviolet light depends on how light propagates within the medium where the microorganism is immersed. A simple geometrical optics analysis, and a fluence evaluation reveal some reservoirs wh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::871aa111e9293b43a70513889b880a15
https://doi.org/10.1016/j.ijleo.2021.168269
https://doi.org/10.1016/j.ijleo.2021.168269
Publikováno v:
Optical Materials. 31:696-699
The dispersive refractive index and the thickness of alginate polymer films have been obtained by using the envelope-extremes location technique. The uncertainty in the determination of the refractive index is of the order of 0.01. The alginate polym
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3a58831f2a5a84d8057cc5c2fb97417
https://doi.org/10.1016/j.optmat.2008.08.003
https://doi.org/10.1016/j.optmat.2008.08.003
Autor:
Javier Alda, Manuel Silva-López, J. C. Martinez-Anton, Alexander Cuadrado, José Manuel López-Alonso, Francisco Javier González, José M. Ezquerro
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
instname
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
One of the main technical difficulties in the fabrication of optical antennas working as light detectors is the proper design and manufacture of auxiliary elements as load lines and signal extraction structures. These elements need to be quite small
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::19ae9922929c8a251306681a555b0b53
https://doi.org/10.1117/12.2187951
https://doi.org/10.1117/12.2187951
Autor:
J. C. Martinez-Anton, Francisco Javier González, Alexander Cuadrado, Javier Alda, José Manuel López-Alonso, José M. Ezquerro
Publikováno v:
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
E-Prints Complutense. Archivo Institucional de la UCM
instname
Universidad Complutense de Madrid
E-Prints Complutense. Archivo Institucional de la UCM
instname
Fractal antennas have been proposed to improve the bandwidth of resonant structures and optical antennas. Their multiband characteristics are of interest in radiofrequency and microwave technologies. In this contribution we link the geometry of the c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a785062735c428e6e46ef16909c1188d
https://doi.org/10.1117/12.2187946
https://doi.org/10.1117/12.2187946
Autor:
J. C. Martinez-Anton
Publikováno v:
Journal of Optics A: Pure and Applied Optics. 8:S213-S218
We present the use of total internal reflection (TIR) evanescent waves for lithography purposes. In particular, we focus our attention on their singular capabilities to nano-structure surface relief gratings and the potentialities for nano-photonic d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d310347c33fd85f84ef9320d056f4ad7
https://doi.org/10.1088/1464-4258/8/4/s22
https://doi.org/10.1088/1464-4258/8/4/s22
Publikováno v:
E-Prints Complutense. Archivo Institucional de la UCM
instname
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
instname
E-Prints Complutense: Archivo Institucional de la UCM
Universidad Complutense de Madrid
Conventional microscopy techniques, such as atomic force microscopy (AFM), scanning electron microscopy (SEM), and confocal microscopy (CM) are not suitable for on-line surface inspection of fine metallic wires. In the recent years, some optical tech
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7546a6d5ca567cc4ad47f299457db8d
https://doi.org/10.1016/j.apsusc.2004.05.240
https://doi.org/10.1016/j.apsusc.2004.05.240
Autor:
J. C. Martinez-Anton, Óscar Esteban
Publikováno v:
Thin Solid Films. :90-94
Interference in an air gap between a reference surface (a glass) and the surface to measure can be used to obtain its reflectance in a robust way and also to obtain the ellipsometric parameter Δ. In the methodology proposed, there is no need to meas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9ae38ef4728ee6ae13be95a494d70c19
https://doi.org/10.1016/j.tsf.2003.12.050
https://doi.org/10.1016/j.tsf.2003.12.050
Publikováno v:
Thin Solid Films. :288-291
The envelope technique is a powerful analytical tool already known in spectrophotometry, but only recently introduced in ellipsometry. We will develop its formalism for tan ψ in weakly absorbing interference films and see how data extraction can be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff38f5035aaa91e8b28464412fcddd3f
https://doi.org/10.1016/j.tsf.2004.01.014
https://doi.org/10.1016/j.tsf.2004.01.014