Zobrazeno 1 - 5
of 5
pro vyhledávání: '"C G Schroer"'
Pump-probe X-ray holographic imaging of laser-induced cavitation bubbles with femtosecond FEL pulses
Autor:
M. Vassholz, H. P. Hoeppe, J. Hagemann, J. M. Rosselló, M. Osterhoff, R. Mettin, T. Kurz, A. Schropp, F. Seiboth, C. G. Schroer, M. Scholz, J. Möller, J. Hallmann, U. Boesenberg, C. Kim, A. Zozulya, W. Lu, R. Shayduk, R. Schaffer, A. Madsen, T. Salditt
Publikováno v:
Nature Communications, Vol 12, Iss 1, Pp 1-11 (2021)
Cavitation bubbles show many nonlinear characteristics of liquid and gas phase. Here the authors demonstrate coherent diffractive imaging of cavitation bubble using infrared pump and XFEL probe and discuss the formation and evolution of the bubbles.
Externí odkaz:
https://doaj.org/article/6b4b4163b4e642b694afdef200de289b
Autor:
C Ossig, N Pyrlik, R Carron, G Fevola, S Patjens, C Strelow, J Flügge, A Kolditz, J Siebels, J Garrevoet, K Spiers, M Seyrich, D Brückner, J Hagemann, F Seiboth, A Schropp, G Falkenberg, A Mews, C G Schroer, T Kipp, M E Stuckelberger
Publikováno v:
Journal of Physics: Energy. 4:045007
Cost efficiency and defect passivation are the two major challenges that thin-film solar cells have to overcome for economic competitiveness. For Cu(In,Ga)Se 2 solar cells, the first is addressed by an increase of the Ga/In ratio, which widens the ba
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a5d0b6763c132386d42f004677c8faf
https://doi.org/10.1088/2515-7655/ac9256
https://doi.org/10.1088/2515-7655/ac9256
Publikováno v:
Optics express. 25(25)
We present light induced refractive index changes in iron doped lithium niobate detected with a novel microscopy technique called ptychography. This method determines the change of the refractive index together with the intensity distribution of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::ac3a5c49c81a033c4d57355e26caad67
https://pubmed.ncbi.nlm.nih.gov/29245835
https://pubmed.ncbi.nlm.nih.gov/29245835
Autor:
A, Schropp, P, Boye, A, Goldschmidt, S, Hönig, R, Hoppe, J, Patommel, C, Rakete, D, Samberg, S, Stephan, S, Schöder, M, Burghammer, C G, Schroer
Publikováno v:
Journal of microscopy. 241(1)
We used hard X-ray scanning microscopy with ptychographic coherent diffraction contrast to image a front-end processed passivated microchip fabricated in 80 nm technology. No sample preparation was needed to image buried interconnects and contact lay
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::a58287f5cec30913524d026a76c78841
https://pubmed.ncbi.nlm.nih.gov/21118244
https://pubmed.ncbi.nlm.nih.gov/21118244
Autor:
D Dzhigaev, A Shabalin, T Stankevič, U Lorenz, R P Kurta, F Seiboth, J Wallentin, A Singer, S Lazarev, O M Yefanov, M Borgström, M N Strikhanov, L Samuelson, G Falkenberg, C G Schroer, A Mikkelsen, R Feidenhans`l, I A Vartanyants
Publikováno v:
Journal of Optics; Jun2016, Vol. 18 Issue 6, p1-1, 1p