Zobrazeno 1 - 10
of 39
pro vyhledávání: '"C G H Walker"'
Autor:
A.-K. Thamm, J. Wei, J. Zhou, C. G. H. Walker, H. Cabrera, M. Demydenko, D. Pescia, U. Ramsperger, A. Suri, A. Pratt, S. P. Tear, M. M. El-Gomati
Publikováno v:
Applied Physics Letters, 120 (5)
We simulate the electronic system of ejected electrons arising when a tip, positioned few 10 nm away from a surface, is operated in the field emission regime. We find that, by repeated quantum reflections (“quantum skipping”), electrons produced
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0cfda1ac22b27d49097970364066032c
Autor:
Thomas Michlmayr, Maksym Hennadiiovych Demydenko, C. G. H. Walker, Danilo Pescia, S.P. Tear, T. Bahler, Urs Ramsperger, Ann-Katrin Thamm, M.M. El Gomati, M Bodik, Andrew Pratt
Publikováno v:
2021 34th International Vacuum Nanoelectronics Conference (IVNC).
In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work
Autor:
Dimos Poulikakos, Hadi Eghlidi, C. G. H. Walker, Efstratios Mitridis, Thomas Kreiner, Thomas M. Schutzius
Publikováno v:
Nano Letters, 19 (3)
Nano Letters
Nano Letters
Surface fogging is a common phenomenon that can have significant and detrimental effects on surface transparency and visibility. It affects the performance in a wide range of applications including windows, windshields, electronic displays, cameras,
Publikováno v:
Journal of Microscopy, 279 (3)
Journal of Microscopy
Journal of Microscopy
We report the working of a novel detector design based on a Bessel Box (BB) electron energy analyser in a scanning electron microscope (SEM). We demonstrate the application of our detector for elemental identification through Auger electron detection
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4daa4cbd3e2f8ad81f9891f6352f9a41
https://hdl.handle.net/20.500.11850/465894
https://hdl.handle.net/20.500.11850/465894
Autor:
C. G. H. Walker, Cem Kincal, Umut Kamber, Ashish Suri, Oguzhan Gurlu, Andrew Pratt, Mohamed M. El-Gomati, S. P. Tear
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena, 241
The interpretation of images generated by scanning electron microscopes (SEMs) requires quantifiable and well-understood contrast. Furthermore, recent interest in probing samples using low-energy electrons to extract surface information is pushing to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::57ee1722fa0669976e44c9d83ee31eae
https://hdl.handle.net/20.500.11850/424334
https://hdl.handle.net/20.500.11850/424334
Autor:
Matthias Reininger, C. G. H. Walker, Sebastian Lerch, Hadi Eghlidi, Athanasios Milionis, Dimos Poulikakos, Thomas M. Schutzius
Publikováno v:
ACS Nano, 12 (8)
ACS Nano
ACS Nano
Ice nucleation from vapor presents a variety of challenges across a wide range of industries and applications including refrigeration, transportation, and energy generation. However, a rational comprehensive approach to fabricating intrinsically icep
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 415:17-24
The transmission of electrons with energies 15 keV and 30 keV through Si and Au films of 100 nm thickness each have been studied in a Scanning Transmission Electron Microscope. The electrons that were transmitted through the films were detected using
Publikováno v:
Surface and Interface Analysis. 49:34-46
A new form of charged particle energy analyser is proposed. It is broadly based on the 180° magnetic spectrograph, but is intended to detect charged particles moving out of the dispersion plane with a helical motion. The analyser has the capability
Autor:
C. G. H. Walker, Wolfgang S. M. Werner
Publikováno v:
Journal of Electron Spectroscopy and Related Phenomena. 241:146957
Publikováno v:
2018 31st International Vacuum Nanoelectronics Conference (IVNC)
A miniature electron energy analyzer (Bessel box – BB) is described. The trajectory of electrons in the BB is simulated and results obtained using the BB are compared with these simulations. Its use in the Near Field Emission Scanning Electron Micr