Zobrazeno 1 - 10
of 68
pro vyhledávání: '"C F Kisielowski"'
Crystalline Arrangement of Organic Molecules in Ammonium Urates as Determined by Electron Microscopy
Publikováno v:
Microscopy and Microanalysis. 28:2238-2241
Publikováno v:
Helveg, S; Kisielowski, CF; Jinschek, JR; Specht, P; Yuan, G; & Frei, H. (2015). Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity. Micron, 68, 176-185. doi: 10.1016/j.micron.2014.07.009. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/19d8z5cx
© 2014. Transmission electron microscopy (TEM) has become an indispensable technique for studying heterogeneous catalysts. In particular, advancements of aberration-corrected electron optics and data acquisition schemes have made TEM capable of deli
Publikováno v:
Microscopy and Microanalysis. 23:2068-2069
Autor:
Quentin M. Ramasse, Martin Ek, Stig Helveg, C F Kisielowski, Poul Georg Moses, Joerg R. Jinschek, Logi Arnarson
Publikováno v:
Microscopy and Microanalysis. 23:904-905
Publikováno v:
Acta Crystallographica Section A Foundations and Advances. 73:C62-C62
Publikováno v:
Microscopy and Microanalysis. 22:1252-1253
Publikováno v:
Microscopy and Microanalysis. 21:2085-2086
Publikováno v:
Microscopy and Microanalysis. 21:2441-2442
Autor:
Hyun Deog Yoo, Yanliang Liang, Yifei Li, C F Kisielowski, Yan Yao, Hector A. Calderon, F. C. Hernandez
Publikováno v:
Microscopy and Microanalysis. 21:1057-1058
Autor:
Eicke R. Weber, C. Dieker, H. Fujii, C F Kisielowski, G. S. Sudhir, Nathan Newman, William S. Wong, Michael Rubin, Zuzanna Liliental-Weber
Publikováno v:
Applied Surface Science. :471-476
Thin films of AlN and GaN were grown by pulsed laser deposition on c-plane sapphire substrates. It is demonstrated that the surface morphology and the structure of layers can actively be controlled by adjusting the nitrogen partial pressure during th