Zobrazeno 1 - 10
of 25
pro vyhledávání: '"C Auricchio"'
Autor:
M. Carissimi, C. Auricchio, E. Calvetti, L. Capecchi, M. Torres, S. Zanchi, P. Gupta, R. Zurla, A. Cabrini, D. Gallinari, F. Disegni, M. Borghi, E. Palumbo, A. Redaelli, M. Pasotti
Publikováno v:
ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC).
Autor:
S. Zanchi, S. Rossi, Alessandro Cabrini, Laura Capecchi, Marco Pasotti, Guido Torelli, C. Auricchio, Riccardo Zurla, Vikas Rana, F. Disegni, Paola Zuliani, Emanuela Calvetti, D. Manfre, C. Torti, R. Mukherjee, L. Croce, A. Gambero, P. Mishra, D. Gallinari, Marcella Carissimi, Donatella Brambilla, Vivek Tyagi
Publikováno v:
ESSCIRC
This letter presents a 2-Mb embedded phase change memory (ePCM) macrocell designed in 90-nm BJT-CMOS-DMOS (BCD) technology able to address the next generation of automotive and smart-power products exploiting an ePCM cell based on a Ge-rich chalcogen
Autor:
R Sangiuolo, Claudio Pandozi, Vincenzo Schillaci, F Aperuta, L Rossi, V Ducceschi, C Auricchio, Gianluigi Bencardino, Luca Segreti, Alberto Arestia, Maurizio Malacrida
Publikováno v:
EP Europace. 22
Funding Acknowledgements NO FUNDING Background Many studies demonstrated the importance of an optimal tissue contact to obtain safe and effective lesions and to improve the clinical outcome in ablation of cavotricuspid isthmus (CTI) for typical right
Autor:
Laura Capecchi, Marco Pasotti, Guido Torelli, L. Croce, Alessandro Cabrini, Riccardo Zurla, Marcella Carissimi, Daniele Gallinari, Emanuela Calvetti, C. Auricchio, Donatella Brambilla, Vikas Rana, Cristina Mazzaglia
Publikováno v:
IEEE Journal of Solid-State Circuits. 53:2114-2125
In the frame of power electronics applications, the request for smart and reconfigurable devices is pushing integration technologies in the direction of embedded systems. In this scenario, microcontrollers play a key role, and the availability of emb
Background: Cardiac resynchronisation therapy (CRT) reduces morbidity and mortality in appropriately selected patients with heart failure and is strongly recommended for such patients by guidelines. A European Society of Cardiology (ESC) CRT survey c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2127::6e1121396d99f259401ae97411160f6c
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3107383
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3107383
Autor:
Guido Torelli, Laura Capecchi, Vikas Rana, Riccardo Zurla, Marcella Carissimi, D. Gallinari, Alessandro Cabrini, Emanuela Calvetti, L. Croce, Donatella Brambilla, C. Auricchio, Marco Pasotti, C. Mazzaglia
Publikováno v:
ESSCIRC
The demand for more and more efficient management of power systems is causing BCD technologies to move forward in the integration of additional digital functions, and the use of microcontrollers in products has become a common practice. In this persp
Background: The World Gastroenterology Organization recommends developing national guidelines for the diagnosis of Celiac Disease (CD): hence a profile of the diagnosis of CD in each country is required. We aim to describe a cross-sectional picture o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2127::a7bb7a403a4382c9b7a6f916d1d63cbf
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3110585
https://pergamos.lib.uoa.gr/uoa/dl/object/uoadl:3110585
Akademický článek
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Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures.
The objective of this paper is to present a test structure introduced in the scribe lines designed to detect process drift and to characterize product performances, i.e. delay and VDDmin. A brief overview of the structure, designed in a ST-Microelect
Autor:
Michele Borgatti, Pierluigi Rolandi, C. Auricchio, Alfonso Maurelli, A. Martino, R. Pelliconi
Publikováno v:
Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710).
A modified Flash-EEPROM device is presented. This device operates as a non-volatile programmable pass transistor. Program and erase, operations are performed on a Flash-EEPROM cell coupled to a pass-transistor. Written and erased states of the flash