Zobrazeno 1 - 10
of 47
pro vyhledávání: '"C A Sheridan"'
Publikováno v:
Water Science and Technology, Vol 85, Iss 6, Pp 1765-1782 (2022)
The objectives of this study were to: (1) assess the intensification of chemical oxygen demand (COD) and phosphate (PO4-P) removal; and (2) generate a set of rate constants of COD degradation (kCOD) and phosphate (kPO4-P) removal for the treatment of
Externí odkaz:
https://doaj.org/article/ba5376b143864cb08c67b87074c843d9
Autor:
Lucile C. Teague Sheridan, Don Nedeau
Publikováno v:
EDFA Technical Articles. 22:22-28
Scanning capacitance microscopy (SCM) and nanoprobing are key tools for isolating and understanding transistor level fails. In this case study, SCM and nanoprobing are used to determine the electrical characteristics of cluster-type failures in 14 nm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd8deb5750c89a5c06be2252660b3683
https://doi.org/10.31399/asm.edfa.2020-2.p022
https://doi.org/10.31399/asm.edfa.2020-2.p022
Autor:
Daniel Marienfeld, Randy W. Mann, Lucile C. Teague Sheridan, Yuncheng Song, Chong Khiam Oh, Joseph Versaggi, Sheng Xie, Dirk Fimmel, Wolfgang Finger, Dapeng Sun, Matthias Hoffmann
Publikováno v:
2019 IEEE 11th International Memory Workshop (IMW).
This work reports the application of an ultra-fast insitu characterization capability in SRAM array in advanced nodes. The methodology was tested in fully functional SRAM arrays in 14 nm and 7 nm FinFET nodes, allowing assessment of individual device
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e07528e71def4ad442e734cdc156d1b9
https://doi.org/10.1109/imw.2019.8739413
https://doi.org/10.1109/imw.2019.8739413
Publikováno v:
Beddard, A, Sheridan, C E, Barnes, M & Green, T C 2016, ' Improved Accuracy Average Value Models of Modular Multilevel Converters ', I E E E Transactions on Power Delivery, vol. 31, no. 5, pp. 2260-2269 . https://doi.org/10.1109/TPWRD.2016.2535410
Modular multilevel converters (MMCs) have become the converter topology of choice for voltage-source converter-high-voltage direct-current systems. Excellent work has previously been conducted to develop much needed average value models (AVM) for the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::81249d3ce5843ab73ea1209e54ab7f69
https://doi.org/10.1109/tpwrd.2016.2535410
https://doi.org/10.1109/tpwrd.2016.2535410
Publikováno v:
International Symposium for Testing and Failure Analysis.
It is widely acknowledged that Atomic force microscopy (AFM) methods such as conductive probe AFM (CAFM) and Scanning Capacitance Microscopy (SCM) are valuable tools for semiconductor failure analysis. One of the main advantages of these techniques i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::de8d24bb7aee0b447b91f2b0be518bb1
https://doi.org/10.31399/asm.cp.istfa2018p0543
https://doi.org/10.31399/asm.cp.istfa2018p0543
Autor:
Tanya Schaeffer, Lucile C. Teague Sheridan, Arnaud Bousquet, Liang-Shan Chen, Bianzhu Fu, Lowell Hodgkins, Chongkhiam Oh
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper highlights the application of nanoprobing technique and electron tomography analysis to characterize the tiny gate oxide pinhole defect in NMOS FinFET devices. Nanoprobing technique was utilized to achieve a better understanding on the fai
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fdbfa77161dd335d72030f2753634140
https://doi.org/10.31399/asm.cp.istfa2017p0451
https://doi.org/10.31399/asm.cp.istfa2017p0451
Autor:
Sreenath Arva, Karthik Kalaiazhagan, Lucile C. Teague Sheridan, Satish Kodali, Chong Khiam Oh
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper presents unique case studies describing the use of EBAC technique. Front as well as backside EBAC on relatively smaller nets is presented to isolate logic fails which are otherwise hard to capture using conventional failure analysis techni
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4de10a613842d0172ad0358ad24544b
https://doi.org/10.31399/asm.cp.istfa2017p0469
https://doi.org/10.31399/asm.cp.istfa2017p0469
Publikováno v:
International Symposium for Testing and Failure Analysis.
Atomic force microscopy (AFM) methods have provided a wealth of knowledge into the topographic, electrical, mechanical, magnetic, and electrochemical properties of surfaces and materials at the micro- and nanoscale over the last several decades. More
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::82c09980ae1f9fffef7da6d038d63da4
https://doi.org/10.31399/asm.cp.istfa2017p0606
https://doi.org/10.31399/asm.cp.istfa2017p0606
Publikováno v:
International Symposium for Testing and Failure Analysis.
There are several methods commonly used to locate the area of interest (AOI), such as using layout landmarks, applying laser marks, focus ion beam marks, etc. This paper discusses another method which can improve the job efficiency and cost-effective
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a4220de7a24b263631633ebab8f1c8f7
https://doi.org/10.31399/asm.cp.istfa2017p0550
https://doi.org/10.31399/asm.cp.istfa2017p0550
Autor:
J. Sannier, C. K. Sheridan, Adam E. Croxford, Ramesh K. Aggarwal, Sonia Consuegra, Michael Drees, J. Elderson, Thuy T. T. Nguyen, M. R. Douglas, L. D. Power, N. Frascaria-Lacoste, Joel Allainguillaume, C. Omoto, Marinus J. M. Smulders, Santan Barthwal, M. I. Zucchi, M. Monteiro, Michael A. D. Goodisman, P. Bertolino, Morgan Pearcy, Delphine Vanhaecke, J. F. Fernández-Manjarrés, Baoling Guo, E. Díaz-Ferguson, Koji Takayama, Junya Ono, Steven T. Kalinowski, S. Martinelli, M. M. Bajay, G.D. Esselink, Carlos Garcia de Leaniz, Laurent Keller, G. M. Wimp, Paul K. Hayes, H. S. Ginwal, Santosh Sathe, R. John Nelson, E. den Belder, Emily A. Matthews, Yan Hong, Antoinette Kotze, Mariko Tamura, Dan S. Sanderson, R. Wickneswari, A. S. Williams, Amber M. Messmer, Yoichi Tateishi, Anita Rawat, Thorsten B. H. Reusch, Volker Witte, Chunhong Li, Ninh V. Vu, Matthew B. Hamilton, J. B. Pinheiro, W. Y. Liew, Priti Chauhan, Tadashi Kajita, Desiré L. Dalton, Florian Leese, A. Sukganah, Albert Lalremruata, Elisabeth I. Meyer, Linda Medlin, V. A. C. Pavinato, Gregory R. Moyer, Steffi Gäbler-Schwarz, Ben F. Koop
Publikováno v:
Molecular Ecology Resources
Molecular Ecology Resources, 11(1), 219-222
Molecular Ecology Resources 11 (2011) 1
Molecular Ecology Resources, 11(1), 219-222
Molecular Ecology Resources 11 (2011) 1
This article documents the addition of 238 microsatellite marker loci and 72 pairs of Single Nucleotide Polymorphism (SNP) sequencing primers to the Molecular Ecology Resources Database. Loci were developed for the following species: Adelges tsugae,
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c6bb0685b5b1e020d19c3b17025eb10a
https://doi.org/10.1111/j.1755-0998.2010.02944.x
https://doi.org/10.1111/j.1755-0998.2010.02944.x