Zobrazeno 1 - 2
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pro vyhledávání: '"C A Polwarth"'
Publikováno v:
Nanotechnology. 17:S121-S127
The apparent height and lateral extent of very small metallic clusters and particles adsorbed on flat substrates have been calculated for frequency-modulation non-contact atomic force microscopy (ncAFM). The ncAFM scanning tip was modelled as a Si sp
Publikováno v:
Nanotechnology; Apr2006, Vol. 17 Issue 7, p121-127, 7p