Zobrazeno 1 - 6
of 6
pro vyhledávání: '"César Beltrán-Castañón"'
Publikováno v:
Entropy, Vol 23, Iss 11, p 1541 (2021)
Several supervised machine learning algorithms focused on binary classification for solving daily problems can be found in the literature. The straight-line segment classifier stands out for its low complexity and competitiveness, compared to well-kn
Externí odkaz:
https://doaj.org/article/d056e445ec234d258a3aa4d1a2eccb2a
Publikováno v:
Educación, Vol 33, Iss 64 (2024)
Externí odkaz:
https://doaj.org/article/ab6c78da5e0c4e8a8d400b5e052e486e
This book constitutes the refereed post-conference proceedings of the 21st Iberoamerican Congress on Pattern Recognition, CIARP 2016, held in Lima, Peru, in November 2016.The 69 papers presented were carefully reviewed and selected from 131 submiss
Publikováno v:
2013 26th Conference on Graphics, Patterns and Images Tutorials.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f59698029c30868e8c23ea9494d0d76b
https://doi.org/10.1109/sibgrapi-t.2013.4
https://doi.org/10.1109/sibgrapi-t.2013.4
Autor:
Zambrano, C. E. P., Caceres, J. C. G., Ticona, J. R., Beltran-Castanon, N. J., Cutipa, J. M. R., César Beltrán Castañón
Publikováno v:
Scopus-Elsevier
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7b771ef4f55219e113511745902a885a
http://www.scopus.com/inward/record.url?eid=2-s2.0-85057617053&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-85057617053&partnerID=MN8TOARS
Autor:
Guillaume Noyel, Michel Jourlin
Publikováno v:
21st Iberoamerican Congress on Pattern Recognition (CIARP 2016)
21st Iberoamerican Congress on Pattern Recognition (CIARP 2016), International Association for Pattern Recognition (IAPR), Nov 2016, Lima, Peru. pp.36-43, ⟨10.1007/978-3-319-52277-7_5⟩
www.ciarp2016.org
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications ISBN: 9783319522760
CIARP
21st Iberoamerican Congress on Pattern Recognition (CIARP 2016), International Association for Pattern Recognition (IAPR), Nov 2016, Lima, Peru. pp.36-43, ⟨10.1007/978-3-319-52277-7_5⟩
www.ciarp2016.org
Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications ISBN: 9783319522760
CIARP
The final publication is available at Springer via http://dx.doi.org/10.1007/978-3-319-52277-7_5; International audience; Asplünd 's metric, which is useful for pattern matching, consists in a double-sided probing, i.e. the over-graph and the sub-gr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e69cd7ebdfd59cc115d06ef1ade268cb
https://hal.archives-ouvertes.fr/hal-01316581v3/document
https://hal.archives-ouvertes.fr/hal-01316581v3/document