Zobrazeno 1 - 10
of 10
pro vyhledávání: '"Byungchoul Park"'
Autor:
Byungchoul Park, Byungwook Ahn, Hyun-Seung Choi, Jinwoong Jeong, Kangmin Hwang, Taewoo Kim, Myung-Jae Lee, Youngcheol Chae
Publikováno v:
2023 IEEE International Solid- State Circuits Conference (ISSCC).
Autor:
Youngcheol Chae, Chanmin Park, Myung-Jae Lee, Injun Park, Yoondeok Na, Byungchoul Park, Woojun Choi
Publikováno v:
IEEE Journal of Solid-State Circuits. 56:2956-2967
This article presents a 64 $\times $ 64 indirect time-of-flight (iToF) image sensor with a depth range of 50 m, integrated into a 1P4M 110-nm CMOS process. The sensor is based on a single-photon avalanche diode (SPAD), the range-dependent phase delay
Publikováno v:
IEEE Journal of Solid-State Circuits. 55:898-907
This article presents a 640 $\times $ 640 fully dynamic CMOS image sensor for the always-on operation. It consists of a dynamic pixel source follower (SF), whose output signal is sampled into a parasitic column capacitor and then read out by a dynami
A 40-m Range 90-frames/s CMOS Time-of-Flight Sensor Using SPAD and In-Pixel Time-Gated Pulse Counter
Publikováno v:
IEEE Solid-State Circuits Letters. 3:422-425
This letter presents a CMOS indirect time-of-flight (i-ToF) image sensor, which is based on a single-photon avalanche diode (SPAD) and a compact in-pixel time-gated pulse counter. The proposed SPAD-based i-ToF sensor makes it possible to achieve a ti
Publikováno v:
IEEE Transactions on Electron Devices. 66:2986-2991
Silicon single-photon avalanche diodes (Si-SPADs) fabricated with standard CMOS technology and providing the advantages of low noise, low cost, and compatibility with additional circuits are promising candidates for single-photon detection fields. Th
Autor:
Won-Yong, Ha, Eunsung, Park, Byungchoul, Park, Youngcheol, Chae, Woo-Young, Choi, Myung-Jae, Lee
Publikováno v:
Optics Express. 30:14958
This paper presents the effect of shallow trench isolation (STI) on the dark count rate (DCR) and after-pulsing probability (APP) of deep-junction-based single-photon avalanche diodes (SPADs). Two different SPADs were fabricated in 110 nm CMOS image
Publikováno v:
Silicon Photonics XV.
Single photon avalanche diodes (SPADs) manufactured through the standard CMOS process have a major advantage in reducing the cost and expendability in comparison with the SPAD made with the custom process. SPAD is a single photon sensitive diode usin
Publikováno v:
Microelectronics Reliability. :610-613
Single photon avalanche diode (SPAD) is one of the promising candidates among photodetectors due to its high sensitivity and accuracy. Along with the existing custom compound avalanche diodes, SPADs fabricated in CMOS technology have been suggested a
Publikováno v:
VLSI Circuits
This paper presents a $640\times 640$ fully dynamic CMOS image sensor for always-on object recognition. A pixel output is sampled with a dynamic source follower (SF) into a parasitic column capacitor, which is readout by a dynamic single-slope (SS) A
Publikováno v:
VLSI Circuits
This paper presents a time-of-flight (ToF) image sensor for outdoor applications. The sensor employs a gain-modulated avalanche photodiode (APD) that achieves high modulation frequency. The suppression capability of background light is greatly improv