Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Byong Hyuk Chon"'
Publikováno v:
IEEE Photonics Journal, Vol 15, Iss 1, Pp 1-9 (2023)
Reflective Fourier ptychographic microscopy has much potential for industrial surface inspection due to the ability to overcome the physical limits of the numerical aperture of the optical microscopy. However, the time cost for misalignment calibrati
Externí odkaz:
https://doaj.org/article/c05c3ebb130b4089be87cf5fe2823bdd
Publikováno v:
Optical Engineering. 62
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0c321d22e84eab6b4eeff2ee638313ab
https://doi.org/10.1117/1.oe.62.4.044106
https://doi.org/10.1117/1.oe.62.4.044106
Publikováno v:
Optics express. 27(23)
Fourier ptychography uses a phase retrieval algorithm to reconstruct a high-resolution image with a wide field-of-view. Reflective-type Fourier ptychographic microscopy (FPM) is expected to be very useful for surface inspection, but the reported meth
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::45aecec883625f6915628d765b372181
https://pubmed.ncbi.nlm.nih.gov/31878486
https://pubmed.ncbi.nlm.nih.gov/31878486
Publikováno v:
Optics and Lasers in Engineering. 138:106418
Fourier ptychographic microscopy (FPM) is a promising phase retrieval algorithm that does not need interferometry. Recently, reflective FPM has been highlighted as a measuring method for surface inspection in the industry, but using it is challenging
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d5794f7459153a9513c6ac1d07bdf96b
https://doi.org/10.1016/j.optlaseng.2020.106418
https://doi.org/10.1016/j.optlaseng.2020.106418