Toward Ideal Low‐Frequency Noise in Monolayer CVD MoS2 FETs: Influence of van der Waals Junctions and Sulfur Vacancy Management.

Autor: Shin, Wonjun^1,2 (AUTHOR) swj0107@snu.ac.kr, Byeon, Junsung³ (AUTHOR), Koo, Ryun‐Han¹ (AUTHOR), Lim, Jungmoon³ (AUTHOR), Kang, Jung Hyeon⁴ (AUTHOR), Jang, A‐Rang⁴ (AUTHOR), Lee, Jong‐Ho^1,5 (AUTHOR), Kim, Jae‐Joon¹ (AUTHOR), Cha, SeungNam³ (AUTHOR) chasn@skku.edu, Pak, Sangyeon⁶ (AUTHOR) spak@hongik.ac.kr, Lee, Sung‐Tae⁶ (AUTHOR) lst777@hongik.ac.kr

Publikováno v: Advanced Science. 7/24/2024, Vol. 11 Issue 28, p1-12. 12p.

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Toward Ideal Low-Frequency Noise in Monolayer CVD MoS 2 FETs: Influence of van der Waals Junctions and Sulfur Vacancy Management.

Autor: Shin W; Inter-University Semiconductor Research Center, Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea.; Department of Semiconductor Convergence Engineering, Sungkyunkwan University, Gyeonggi-do, Suwon, 16419, Republic of Korea., Byeon J; Department of Physics, Sungkyunkwan University, Suwon, Gyeonggi-do, 16419, Republic of Korea., Koo RH; Inter-University Semiconductor Research Center, Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea., Lim J; Department of Physics, Sungkyunkwan University, Suwon, Gyeonggi-do, 16419, Republic of Korea., Kang JH; Division of Electrical, Electronic and Control Engineering, Kongju National University, Cheonan, 31080, Republic of Korea., Jang AR; Division of Electrical, Electronic and Control Engineering, Kongju National University, Cheonan, 31080, Republic of Korea., Lee JH; Inter-University Semiconductor Research Center, Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea.; Ministry of Science and ICT, Sejong, 30109, Republic of Korea., Kim JJ; Inter-University Semiconductor Research Center, Department of Electrical and Computer Engineering, Seoul National University, Seoul, 08826, Republic of Korea., Cha S; Department of Physics, Sungkyunkwan University, Suwon, Gyeonggi-do, 16419, Republic of Korea., Pak S; School of Electronic and Electrical Engineering, Hongik University, Seoul, 04066, Republic of Korea., Lee ST; School of Electronic and Electrical Engineering, Hongik University, Seoul, 04066, Republic of Korea.

Publikováno v: Advanced science (Weinheim, Baden-Wurttemberg, Germany) [Adv Sci (Weinh)] 2024 Jul; Vol. 11 (28), pp. e2307196. Date of Electronic Publication: 2024 May 21.