Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Butters BA"'
Autor:
Charaev I; Massachusetts Institute of Technology, Cambridge, MA, USA. ilya.charaev@physik.uzh.ch.; University of Zurich, Zurich, Switzerland. ilya.charaev@physik.uzh.ch., Bandurin DA; Department of Materials Science and Engineering, National University of Singapore, Singapore, Singapore. bandurin.d@gmail.com., Bollinger AT; Brookhaven National Laboratory, Upton, NY, USA., Phinney IY; Massachusetts Institute of Technology, Cambridge, MA, USA., Drozdov I; Brookhaven National Laboratory, Upton, NY, USA., Colangelo M; Massachusetts Institute of Technology, Cambridge, MA, USA., Butters BA; Massachusetts Institute of Technology, Cambridge, MA, USA., Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute of Material Science, Tsukuba, Japan., Watanabe K; Research Center for Functional Materials, National Institute of Material Science, Tsukuba, Japan., He X; Brookhaven National Laboratory, Upton, NY, USA.; Department of Chemistry, Yale University, New Haven, CT, USA., Medeiros O; Massachusetts Institute of Technology, Cambridge, MA, USA., Božović I; Brookhaven National Laboratory, Upton, NY, USA.; Department of Chemistry, Yale University, New Haven, CT, USA., Jarillo-Herrero P; Massachusetts Institute of Technology, Cambridge, MA, USA., Berggren KK; Massachusetts Institute of Technology, Cambridge, MA, USA. berggren@mit.edu.
Publikováno v:
Nature nanotechnology [Nat Nanotechnol] 2023 Apr; Vol. 18 (4), pp. 343-349. Date of Electronic Publication: 2023 Mar 20.
Autor:
Onen M; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA 02139, United States of America., Butters BA, Toomey E, Gokmen T, Berggren KK
Publikováno v:
Nanotechnology [Nanotechnology] 2020 Jan 10; Vol. 31 (2), pp. 025204. Date of Electronic Publication: 2019 Sep 25.
Autor:
Onen M; Department of Electrical Engineering and Computer Science , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.; Research Laboratory of Electronics , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Turchetti M; Department of Electrical Engineering and Computer Science , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.; Research Laboratory of Electronics , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Butters BA; Department of Electrical Engineering and Computer Science , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.; Research Laboratory of Electronics , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Bionta MR; Research Laboratory of Electronics , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Keathley PD; Research Laboratory of Electronics , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States., Berggren KK; Department of Electrical Engineering and Computer Science , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.; Research Laboratory of Electronics , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.
Publikováno v:
Nano letters [Nano Lett] 2020 Jan 08; Vol. 20 (1), pp. 664-668. Date of Electronic Publication: 2019 Dec 20.
Autor:
Toomey E; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Onen M; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Colangelo M; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., Butters BA; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA., McCaughan AN; National Institute of Standards and Technology, 325 Broadway, Boulder, Colorado 80305, USA., Berggren KK; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
Publikováno v:
Physical review applied [Phys Rev Appl] 2019; Vol. 11 (3).