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Autor:
Busch, Alexander Anthony
This thesis reports a systematic study of near-band edge linear and nonlinear optical properties of doped and undoped semiconductor multiple quantum well samples, aimed at quantifying and separating the numerous contributions to the overall material
Externí odkaz:
http://hdl.handle.net/2429/14906
Autor:
Busch, Alexander Anthony
An electron beam lithography system was realized by externally controlling a Hitachi S-4 100 field emission scanning electron microscope with a computer. Associated facilities were established for applying resist layers to substrates and for developi
Externí odkaz:
http://hdl.handle.net/2429/5442