Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Burkbard Qeckhoff"'
Publikováno v:
Advances in X-ray Analysis. 37:535-544
A toroidal focLising W/Si multilayer and a planar W/Si multilayer were tested for the possible usefulness for the Energy Dispersive X-Ray Fluorescence Analysis (EDXXRF) of low Z elements.