Zobrazeno 1 - 10
of 46
pro vyhledávání: '"Bunting, A.S."'
Publikováno v:
In Biomaterials October 2016 105:117-126
Autor:
Hilton, G.C., Beall, J.A., Doriese, W.B., Duncan, W.D., Ferreira, L.S., Irwin, K.D., Reintsema, C.D., Ullom, J.N., Vale, L.R., Xu, Y., Zink, B.L., Parkes, W., Bunting, A.S., Dunare, C.C., Gundlach, A.M., Stevenson, J.T.M., Walton, A.J., Schulte, E., Corrales, E., Sienicki, J.P., Bintley, Dan, Ade, P.A.R., Sudiwala, Rashmi V., Woodcraft, Adam L., Halpern, Mark, Holland, W., Audley, M.D., MacIntosh, M.
Publikováno v:
In Nuclear Inst. and Methods in Physics Research, A 2006 559(2):513-515
Autor:
Scarfi, S., Smith, S., Tabasnikov, A., Schmuser, I., Blair, E., Bunting, A.S., Walton, A.J., Murray, A.F., Terry, J.G.
Publikováno v:
2016 International Conference on Microelectronic Test Structures (ICMTS); 2016, p184-189, 6p
Autor:
Zhang, R., Li, Y., Murray, J., Bunting, A.S., Smith, S., Dunare, C.C., Stevenson, J.T.M., Desmulliez, M.P., Walton, A.J.
Publikováno v:
2013 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2013, p37-42, 6p
Publikováno v:
2012 IEEE International Conference on Microelectronic Test Structures; 1/ 1/2012, p61-65, 5p
Autor:
Gruber, D., Li, Y., Smith, S., Tiwari, A., Deng, F., Stokes, A.A., Terry, J.G., Bunting, A.S., Mackay, L., Langridge-Smith, P., Walton, A.J.
Publikováno v:
2011 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2011, p80-84, 5p
Autor:
Li, Y., Fu, Y.Q., Flynn, B.W., Parkes, W., Liu, Y., Brodie, S., Terry, J.G., Haworth, L.I., Bunting, A.S., Stevenson, J.T.M., Smith, S., Walton, A.J.
Publikováno v:
2010 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2010, p52-57, 6p
Autor:
Shulver, B.J.R., Allen, R.A., Walton, A.J., Cresswell, M.W., Stevenson, J.T.M., Smith, S., Bunting, A.S., Dunare, C., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Snell, A.J.
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p165-170, 6p
Autor:
Shulver, B.J.R., Bunting, A.S., Gundlach, A.M., Haworth, L.I., Ross, A.W.S., Smith, S., Snell, A.J., Stevenson, J.T.M., Walton, A.J., Allen, R.A., Cresswell, M.W.
Publikováno v:
2007 IEEE International Conference on Microelectronic Test Structures; 2007, p14-19, 6p
Autor:
Lin, H., Walton, A.J., Dunarc, C.C., Stevenson, J.T.M., Gundlach, A.M., Smith, S., Bunting, A.S.
Publikováno v:
2006 IEEE International Conference on Microelectronic Test Structures; 2006, p143-148, 6p