Single Event Effects Analysis in Readout Integrated Circuits at Cryogenic Temperatures

Autor: Artola, Laurent, Ducret, S., Al Youssef, Ahmad, Buiron, R., Perrier, F., Hubert, Guillaume, Poivey, C.

Publikováno v: AMICSA 2018
AMICSA 2018, Jun 2018, LOUVAIN, Belgium

International audience; This work presents the analyses of single event transients and functional interrupts measured on two designs of readout integrated circuit under a heavy ions beam cooled down at cryogenic temperatures. The analysis of the mult

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::0e9b06a5af7f38c2873d36943e37899c
https://hal.science/hal-01957135

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Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature.

Autor: Art L; Département Physique, Instrumentation, Environnement, Espace (ONERA/DPHY), Université de Toulouse, F-31055 Toulouse, France. laurent.artola@onera.fr., Youssef AA; Département Physique, Instrumentation, Environnement, Espace (ONERA/DPHY), Université de Toulouse, F-31055 Toulouse, France. ahmady07@live.com., Ducret S; Sofradir, 38113 Veurey-Voroize, France. Samuel.Ducret@sofradir.com., Perrier F; Sofradir, 38113 Veurey-Voroize, France. Franck.Perrier@sofradir.com., Buiron R; Sofradir, 38113 Veurey-Voroize, France. Raphael.Buiron@sofradir.com., Gilard O; Centre National d'Etude Spaciale (CNES), 31055 Toulouse, France. Olivier.Gilard@cnes.fr., Mekki J; Centre National d'Etude Spaciale (CNES), 31055 Toulouse, France. Julien.Mekki@cnes.fr., Boutillier M; Centre National d'Etude Spaciale (CNES), 31055 Toulouse, France. Mathieu.Boutillier@cnes.fr., Hubert G; Département Physique, Instrumentation, Environnement, Espace (ONERA/DPHY), Université de Toulouse, F-31055 Toulouse, France. guillaume.hubert@onera.fr., Poivrey C; European Space Research and Technology Centre (ESTEC), European Space Agency (ESA), 2201 AZ Noordwijk, The Netherlands. Christian.Poivey@esa.int.

Publikováno v: Sensors (Basel, Switzerland) [Sensors (Basel)] 2018 Jul 18; Vol. 18 (7). Date of Electronic Publication: 2018 Jul 18.