Zobrazeno 1 - 10
of 135
pro vyhledávání: '"Buckley, Keith"'
Publikováno v:
National Underwriter / P&C. 8/7/2006, Vol. 110 Issue 30, p14-34. 4p. 1 Black and White Photograph, 2 Charts.
Autor:
Buckley, Keith1
Publikováno v:
Academy of Business Research Journal. 2016, Vol. 4, p53-59. 7p.
Publikováno v:
2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop].
Make observations on HBT testing and how test conditions affect projected MTTF and Ea. Baseline bias stress data for TQS BiHEMT process active devices: HBT, D-mode pHEMT, E-mode pHEMT.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6dcb542b531946c710ccecc250f53a3c
https://doi.org/10.1109/rocs.2008.5483622
https://doi.org/10.1109/rocs.2008.5483622
Autor:
Howard, Lisa S.
Publikováno v:
National Underwriter / Property & Casualty Risk & Benefits Management. 08/30/99, Vol. 103 Issue 35, p3. 3p. 1 Black and White Photograph, 1 Graph.
Autor:
Buckley, Keith S.
The purpose of this project was to create guidelines of practice for college athletic directors in creating injury waivers for their departments. It is the complexity of the different issues concerning the waiver that ledSteve Horton, an Assistant At
Externí odkaz:
http://hdl.handle.net/10919/41848
http://scholar.lib.vt.edu/theses/available/etd-03302010-020416/
http://scholar.lib.vt.edu/theses/available/etd-03302010-020416/
