Comparison of methods for the detection of ¹⁰Be with AMS and a new approach based on a silicon nitride foil stack

Autor: Steier, P., Martschini, M., Buchriegler, J., Feige, J., Lachner, J., Merchel, S., Michlmayr, L., Priller, A., Rugel, G., Schmidt, E., Wallner, A., Wild, E. M., Golser, R.

Publikováno v: International Journal of Mass Spectrometry 444(2019), 116175

Natural ¹⁰Be (t1/2 = 1.387 ± 0.012 Ma) is produced by cosmic rays and is present on Earth's surface only at ultratrace concentrations (typically 10⁴ to 10¹⁰ atoms/g). Its cosmogenic origin makes it an important tracer for many applications i

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______4577::2fc5d40b22434993525425a4b353ae7f
https://www.hzdr.de/publications/Publ-20770-1

'Brothers in Arms' – HIF High-Speed PIXE and MEGA Spectrometer

Autor: Renno, A., Buchriegler, J., Dreßler, S., Hanf, D., Munnik, F., Scharf, O., Ziegenrücker, R.

Publikováno v: 2nd International Conference on Applied Mineralogy & Advanced Materials and 13th International Conference on Applied Mineralogy, 05.-09.06.2017, Castellaneta Marina-Taranto, Italy

In a fast growing world with increasing demand on resources like high-tech metals as In, Ga, Ge, or rare earth elements (REE), mineralogists and economic geologists need faster and automated analytical tools to explore mineral deposits, make them acc

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______4577::d323e5053ff1f0a4114b1044c62ce979
https://www.hzdr.de/publications/Publ-25937-1

Full-field PIXE imaging: Multi-frame super-resolution to overcome optics pattern and imaging-based resolution limitations

Autor: Buchriegler, J., Klingner, N., Munnik, F., Nowak, S. H., Borany, J., Ziegenrücker, R.

Publikováno v: 15th International Conference on Particle Induced X-ray Emission, 02.-07.04.2017, Split, Croatia

The combination of a pnCCD-based detector (264 x 264 pixels) with a polycapillary X-ray optics was installed and examined at HZDR [1]. The set-up is intended for PIXE imaging with protons (2-4 MeV) to survey large, flat/polished geological samples wi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______4577::de5e999861b5372d9904e9f44269c99a
https://www.hzdr.de/publications/Publ-24934-1

Relevance of qualitative trace element distribution maps at answering geoscientific questions

Autor: Renno, A. D., Buchriegler, J., Hanf, D., Klingner, N., Munnik, F., Nowak, S. H., Scharf, O., Borany, J., Ziegenrücker, R.

Publikováno v: 23rd International Conference on Ion Beam Analysis IBA-2017, 08.-13.10.2017, Shanghai, China

In recent years significant efforts have been made to combine Particle Induced X-ray Emission (PIXE) techniques with the advantages of the Color X-ray Camera [1] to produce full-field PIXE images of trace element distributions in geological samples [

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______4577::c50c5fcd21c0738779bb3b6b318285de
https://www.hzdr.de/publications/Publ-25936-1

Anwendungen der Röntgenfarbkamera SLcam® in der Geologie und Resourcentechnologie

Autor: Scharf, O., Arkadiev, V., Buchriegler, J., Dressler, S., Kühn, A., Renno, A., Ziegenrücker, R.

Publikováno v: PRORA 2015-Prozessnahe Röntgenanalytik, 12.-13.11.2015, Berlin, Deutschland

Die Messung von mikro-Röntgenfluoreszenzspektren über einer Fläche, ein Vollfeld Röntgenfluoreszenzdatensatz, ermöglicht die Verteilung von Elementen und deren Konzentrationen in einer Probe zu bestimmen. Diese Informationen sind wichtig für di

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od______4577::16516c57d63bcf9d881a454115ccd0e5
https://www.hzdr.de/publications/Publ-22565-1