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Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits.

Autor: Sarker MAR; School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, USA., Jung S; Broadcom Inc., San Jose, CA 95131, USA., Ildefonso A; School of Electrical and Computer Engineering, Georgia Institute of Technology, GA 30318, USA., Khachatrian A; US Naval Research Laboratory, Washington, DC 20375, USA., Buchner SP; US Naval Research Laboratory, Washington, DC 20375, USA., McMorrow D; US Naval Research Laboratory, Washington, DC 20375, USA., Paki P; Defense Threat Reduction Agency, Fort Belvoir, VA 22060, USA., Cressler JD; School of Electrical and Computer Engineering, Georgia Institute of Technology, GA 30318, USA., Song I; School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, USA.

Publikováno v: Sensors (Basel, Switzerland) [Sensors (Basel)] 2020 May 01; Vol. 20 (9). Date of Electronic Publication: 2020 May 01.