Zobrazeno 1 - 10 of 17 pro vyhledávání: '"Brug, H van"'
1
New approach to spectral features modeling
Autor: Brug, H. van, Scalia, P.S.
Publikováno v: Earth Observing Systems XVII, 13-16 August 2012, San Diego, CA, USA, 8510
The origin of spectral features, speckle effects, is explained, followed by a discussion on many aspects of spectral features generation. The next part gives an overview of means to limit the amplitude of the spectral features. This paper gives a dis
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2
Holographic method for detecting amplitude and phase-shift errors and features in EUV ML reticle blanks
Autor: Nijkerk, M.D., Koster, N.B., Brug, H. van, Maas, D.J.
Publikováno v: Extreme Ultraviolet (EUV) Lithography, 22-25 February 2010, San Jose, CA, USA, 7636
A method for actinic inspection of EUV mask blanks is described, in which EUV photoresist is applied to the blank, flood exposed with EUV, and developed. The effect of both phase and reflectivity defects on the reticle is described in terms of a vari
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4
Enhancement of diffusers BSDF accuracy: spectral features effect
Autor: Brug, H. van, Courrèges-Lacoste, G.B., Otter, G.C.J., Schaarsberg, J.G., Delwart, S., Del Bello, U.
Publikováno v: Sensors, Systems and Next-Generation Satellites X, 11-13 September 2006, Stockholm, Sweden, 6361
This paper reports the activities performed in the framework of the ESA contract 18432/04/NL/AR: Enhancement of diffusers BSDF Accuracy. This study was conducted to investigate properties of various diffusers. Diffusers are widely used in space instr
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5
In-process measurements of material removal in fluid jet polishing
Autor: Brug, H. van, Groeneveld, M., Booij, S.M., Braat, J.J.M.
Publikováno v: Osten, W., Interferometry XI: Applications, 10-11 July 2002, Seattle, WA, USA, 4778, 243-250
A prototype of a system for in-process monitoring of material removal in fluid jet polishing (FJP) is presented. The measurements make use of temporal phase unwrapping (TPU) allowing for a large working range. The measurement system will be discussed
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6
Applicability of iTIRM for roughness reduction monitoring
Autor: Bijl, R.J.M. van der, Brug, H. van, Fähnle, O.W., Braat, J.J.M.
Publikováno v: Philip Stahl H., Optical Manufacturing and Testing IV, 31 July-2 August 2001, San Diego, CA, USA, 4451, 340-344
The results obtained with iTIRM during polishing are presented. It is shown that iTIRM unites the working ranges of several other techniques where iTIRM can be used during production where the others can not. The applicable range of iTIRM is shown to
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7
Quantitative roughness measurements with iTIRM
Autor: Bijl, R.J.M. van der, Fähnle, O.W., Brug, H. van, Braat, J.J.M.
Publikováno v: Optical Fabrication and Testing, 18-22 June 2000, Québec, Canada
A new method, iTIRM, is used for quantitative surface roughness measurements of ground and polished surfaces and it is shown to be a useful tool for measuring total surface quality instead of individual roughness parameters.
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9
iTIRM: a nondestructive measuring technique to monitor surface quality during grinding and polishing
Autor: Bijl, R.J.M. van der, Fähnle, O.W., Brug, H. van, Braat, J.J.M.
Publikováno v: Rastogi, P.K.Inaudi, D., International Conference on Trends in Optical Nondestructive Testing, 3-6 May, 2000, Lugano, Switzerland
A new measurement method, called iTIRM, is presented. It is capable of measuring the surface quality, roughness and subsurface damage, of optical surfaces in a nondestructive way. Measurements have been carried out and are presented, showing the capa
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10
Optical Fabrication in the Optics Research Group
Autor: Brug, H. van, Booij, S.M., Bijl, R.J.M. van der, Fähnle, O.W.
Publikováno v: Fawcett, S.C., ASPE 15th Annual Meeting, 22-27 October 2000, Scottsdale, AZ, USA
Within the Optics Research Group there has been, and still is an interest in optical fabrication. The group had its own optical workshop in which the experimental work could be carried out. Recently, the optical workshop has been taken over by TNO/TP
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