Zobrazeno 1 - 10
of 265
pro vyhledávání: '"Bruce Steiner"'
Autor:
Bruce Steiner, Richard D. Spal, David R. Black, Archibald L. Fripp, Harold E. Burdette, Masao Kuriyama, Ashok K. Batra, Richard T. Simchick, Ravindra B. Lal, Ronald C. Dobbyn, David Matthiesen, Brian M. Ditchek, Lodewijk Van Den Berg
Publikováno v:
Journal of Research of the National Institute of Standards and Technology
Irregularities in three crystals grown in space and in four terrestrial crystals grown under otherwise comparable conditions have been observed in high resolution diffraction imaging. The images provide important new clues to the nature and origins o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e61bd04b51a8ff5c47fb098aeeda919c
https://pubmed.ncbi.nlm.nih.gov/28184117
https://pubmed.ncbi.nlm.nih.gov/28184117
Publikováno v:
Journal of Applied Physics. 86:4677-4687
Wafers from mercuric iodide crystals grown in microgravity on two occasions have previously been found to be characterized by a higher hole mobility-lifetime product, which enables energy dispersive radiation detectors with superior resolution. In th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::909fb9b002c334295caa368923a2e6b3
https://doi.org/10.1063/1.371420
https://doi.org/10.1063/1.371420
Autor:
Bruce Steiner, S. G. Bompadre, Larry B. Sorensen, K. E. Miyano, Johnny P. Kirkland, Bruce Ravel, Joseph G. Pellegrino, Joseph C. Woicik, Charles E. Bouldin, Julie O. Cross
Publikováno v:
Physical Review B. 58:R4215-R4218
Diffraction anomalous fine-structure measurements performed at both the Ga and As {ital K} edges have determined the Ga-As bond length to be 2.442{plus_minus}0.005thinsp{Angstrom} in a buried, 213-{Angstrom}-thick Ga{sub 0.785}In{sub 0.215}As layer g
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2452c0338811be56059c667515cb845f
https://doi.org/10.1103/physrevb.58.r4215
https://doi.org/10.1103/physrevb.58.r4215
Publikováno v:
Journal of Crystal Growth. 169:1-12
High resolution synchrotron X-radiation diffraction images of low thermal gradient, low pressure, liquid encapsulated Czochralski (LEC) silicon-doped gallium arsenide display a degree of crystalline order that is far higher than that found in undoped
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2876ad2384220f332ae3267fcfe0d643
https://doi.org/10.1016/0022-0248(96)00152-2
https://doi.org/10.1016/0022-0248(96)00152-2
Publikováno v:
Ferroelectrics. 158:81-85
The growth and detector characteristics of TGS crystals grown in a low gravity environment of space are presented. High resolution monochromatic synchrotron X-ray diffraction imaging of the space grown crystal indicates an extraordinary crystal quali
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::199b3e3c1d35a135cc4399741b9ceb3c
https://doi.org/10.1080/00150199408215997
https://doi.org/10.1080/00150199408215997
Publikováno v:
Journal of Electronic Materials. 22:725-738
High resolution monochromatic synchrotron-radiation diffraction images of five, high quality epitaxial heterojunctions on silicon, gallium arsenide, and indium phosphide substrates display several forms of accommodation to lattice mismatch. From the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f108a835bfe400328d0d786b2b4ebb43
https://doi.org/10.1007/bf02817347
https://doi.org/10.1007/bf02817347
Publikováno v:
Synchrotron Radiation News. 6:11-15
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d4e42332844422c7b1ef30dc323a0bb5
https://doi.org/10.1080/08940889308602749
https://doi.org/10.1080/08940889308602749
Publikováno v:
Journal of Crystal Growth. 128:543-549
High resolution monochromatic synchrotron X-radiation diffraction images of several high quality multilayer systems suggest several factors in the establishment of irregularities in layerd semiconducting crystals. The nucleation of extensive arrays o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2e3bee5cbc318c9d34660bc4a357df65
https://doi.org/10.1016/0022-0248(93)90383-8
https://doi.org/10.1016/0022-0248(93)90383-8
Autor:
David R. Black, Bruce Steiner, Harold E. Burdette, Masao Kuriyama, Richard D. Spal, Archibald L. Fripp, Richard T. Simchick, Ronald C. Dobbyn
Publikováno v:
Journal of Crystal Growth. 114:707-714
High resolution X-ray diffraction images of two directly comparable crystals of lead tin telluride, one Bridgman-grown on Space Shuttle STS 61A and the other terrestrially Bridgman-grown under similar conditions from identical material, present diffe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8dc5af5b0765a92b0afa77281a9d5ce
https://doi.org/10.1016/0022-0248(91)90420-a
https://doi.org/10.1016/0022-0248(91)90420-a
Publikováno v:
Progress in Crystal Growth and Characterization of Materials. 20:189-216
Lattice irregularities observed in monochromatic synchrotron x-radiation diffraction imaging (topography) are summarized. Important recent advances in sensitivity and resolution are described. The resulting insight into the genesis of variation in hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a533a0beb48770161c2190c5161044c7
https://doi.org/10.1016/0960-8974(90)90001-9
https://doi.org/10.1016/0960-8974(90)90001-9