Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Bruce Dyer"'
Publikováno v:
Legal Education Review, Vol 8, Iss 2 (1997)
The following paper draws on the experience of the Monash Law School in preparing a case study based on an actual court decision for use in teaching Corporations and Business Associations Law. This is the basic corporate law subject which is done by
Externí odkaz:
https://doaj.org/article/5bb4c16b634f4071b356e5890e45f5cd
Autor:
Silver Heinsar, Jae-Seung Jung, Sebastiano Maria Colombo, Sacha Rozencwajg, Karin Wildi, Kei Sato, Carmen Ainola, Xiaomeng Wang, Gabriella Abbate, Noriko Sato, Wayne Bruce Dyer, Samantha Annie Livingstone, Leticia Pretti Pimenta, Nicole Bartnikowski, Mahe Jeannine Patricia Bouquet, Margaret Passmore, Bruno Vidal, Chiara Palmieri, Janice D. Reid, Haris M. Haqqani, Daniel McGuire, Emily Susan Wilson, Indrek Rätsep, Roberto Lorusso, Jacky Y. Suen, Gianluigi Li Bassi, John F. Fraser
Publikováno v:
Scientific Reports, Vol 11, Iss 1, Pp 1-11 (2021)
Abstract Refractory cardiogenic shock (CS) often requires veno-arterial extracorporeal membrane oxygenation (VA-ECMO) to sustain end-organ perfusion. Current animal models result in heterogenous cardiac injury and frequent episodes of refractory vent
Externí odkaz:
https://doaj.org/article/4de338fa0f9f45c7aac2bfbb324598b1
Publikováno v:
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
The Front Opening Unified Pod (FOUP) is used to protect wafers from the Fab environment when they are not being processed. During Gate stack etch, a process known to be a potential source of etch residuals, wafers are separated in a different FOUP to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::778c75f27425bd1b74b76be503ddce73
https://doi.org/10.1109/asmc51741.2021.9435733
https://doi.org/10.1109/asmc51741.2021.9435733
Autor:
Trejo Rust, David McCarthy, Min Dai, Michael Brodfuehrer, Lingjie Wang, Colleen Meagher, Bruce Dyer, Raymond Van Roijen, Michael D. Steigerwalt, Javier Ayala, Gasner Barthold, Jeffery B. Maxson, Randal Bakken
Publikováno v:
2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
A small but persistent signal in wafer slot order was observed at functional test, affecting logic yield. Through wafer slot Randomization at several operations in the route a process step within high-k metal gate formation was suspected to be causin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e03472cd16acdc49d18a862775295e23
https://doi.org/10.1109/asmc.2017.7969251
https://doi.org/10.1109/asmc.2017.7969251
Publikováno v:
The Journal of the Herpetological Association of Africa. 19:19-21
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f6208f901ae01647c5a5e1d627d7f33c
https://doi.org/10.1080/04416651.1978.9650967
https://doi.org/10.1080/04416651.1978.9650967
Autor:
Bruce Dyer
Publikováno v:
The Journal of the Herpetological Association of Africa. 27:16-17
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::18fa4a9ad363fb1f9db51a1cc637393b
https://doi.org/10.1080/04416651.1982.9650093
https://doi.org/10.1080/04416651.1982.9650093
Publikováno v:
The Journal of the Herpetological Association of Africa. 21:29-30
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::48ed77f012b533dad18192833a4abeb2
https://doi.org/10.1080/04416651.1979.9651004
https://doi.org/10.1080/04416651.1979.9651004
Autor:
Bruce Dyer
Publikováno v:
The Journal of the Herpetological Association of Africa. 20:6-6
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9cba8a007a1f6e87a4a9bb7acfac6140
https://doi.org/10.1080/04416651.1979.9650980
https://doi.org/10.1080/04416651.1979.9650980