Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Bruce Chou"'
Autor:
Jacob S. Levy, Erman Timurdogan, Yu-Sheng Kuo, Gap Youl Lyu, Charles Tsai, Xuejin Yan, Harqkyun Kim, Cristian Stagarescu, Kevin Meneou, Abu Thomas, Ioannis Fragkos, Geoffrey Sitwell, Andrea Trita, Yangyang Liu, Melissa Ziebel, Jerry Byrd, Sven Steinbach, Bruce Chou, William Vis, Arin Abed, Young Kwon, Henri Nykänen, Shih-Han Lo, Janne Ikonen, Juha Larismaa, John Drake, Albert Benzoni, Cyriel Minkenberg, Thomas Schrans, Andrew Rickman
Publikováno v:
Journal of Lightwave Technology. :1-10
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11705984f50f3750ac44a5fb99717c23
https://doi.org/10.1109/jlt.2023.3263069
https://doi.org/10.1109/jlt.2023.3263069
Autor:
Bruce Chou, Brett M. Sawyer, Gap Lyu, Erman Timurdugan, Cyriel Minkenberg, Aaron J. Zilkie, David McCann
Publikováno v:
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::69bb9b12331c71016355fefd9fe2a35a
https://doi.org/10.1109/ectc51906.2022.00071
https://doi.org/10.1109/ectc51906.2022.00071
Publikováno v:
2011 International Reliability Physics Symposium.
CDM-like unipolar pulses are generated at the wafer level with excellent repeatability and linearity. Pulse width and rise time resemble that of FICDM testers. In-situ pre- and post-stress curve tracing reveals the current failure threshold for the d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04473049cdf3c17f41924400ecc4d65e
https://doi.org/10.1109/irps.2011.5784509
https://doi.org/10.1109/irps.2011.5784509
Thesis (M.Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2001.
Includes bibliographical references (leaf 44).
by Bruce C. Po.
M.Eng.
Includes bibliographical references (leaf 44).
by Bruce C. Po.
M.Eng.
Externí odkaz:
http://hdl.handle.net/1721.1/86679
Publikováno v:
Advancing Microelectronics; Jul/Aug2016, Vol. 43 Issue 4, p12-16, 5p