Zobrazeno 1 - 10
of 855
pro vyhledávání: '"Browning, Nigel D"'
Autor:
Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Robinson, Alex W., Browning, Nigel D., Kirkland, Angus I.
The extended Ptychographical Iterative Engine (ePIE) is a widely used phase retrieval algorithm for Electron Ptychography from 4-dimensional (4-D) Scanning Transmission Electron Microscopy (4-D STEM) measurements acquired with a focused or defocused
Externí odkaz:
http://arxiv.org/abs/2411.14915
Autor:
Broad, Zoë, Robinson, Alex W., Wells, Jack, Nicholls, Daniel, Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Electron backscatter diffraction (EBSD) has developed over the last few decades into a valuable crystallographic characterisation method for a wide range of sample types. Despite these advances, issues such as the complexity of sample preparation, re
Externí odkaz:
http://arxiv.org/abs/2407.11724
Autor:
Moshtaghpour, Amirafshar, Velazco-Torrejon, Abner, Nicholls, Daniel, Robinson, Alex W., Kirkland, Angus I., Browning, Nigel D.
Despite the widespread use of Scanning Transmission Electron Microscopy (STEM) for observing the structure of materials at the atomic scale, a detailed understanding of some relevant electron beam damage mechanisms is limited. Recent reports suggest
Externí odkaz:
http://arxiv.org/abs/2406.02207
Autor:
Robinson, Alex W., Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Chi, Miaofang, MacLaren, Ian, Kirkland, Angus I., Browning, Nigel D.
Here we show that compressive sensing allow 4-dimensional (4-D) STEM data to be obtained and accurately reconstructed with both high-speed and low fluence. The methodology needed to achieve these results compared to conventional 4-D approaches requir
Externí odkaz:
http://arxiv.org/abs/2309.14055
Autor:
Nicholls, Daniel, Kobylysnka, Maryna, Wells, Jack, Broad, Zoe, Robinson, Alex W., McGrouther, Damien, Moshtaghpour, Amirafshar, Kirkland, Angus I., Fleck, Roland A., Browning, Nigel D.
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive materials, t
Externí odkaz:
http://arxiv.org/abs/2309.09617
Autor:
Broad, Zoë, Nicholls, Daniel, Wells, Jack, Robinson, Alex W., Moshtaghpour, Amirafshar, Masters, Robert, Hughes, Louise, Browning, Nigel D.
Despite advancements in electron backscatter diffraction (EBSD) detector speeds, the acquisition rates of 4-Dimensional (4D) EBSD data, i.e., a collection of 2-dimensional (2D) diffraction maps for every position of a convergent electron probe on the
Externí odkaz:
http://arxiv.org/abs/2307.08480
Autor:
Nicholls, Daniel, Wells, Jack, Robinson, Alex W., Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Subsampling and fast scanning in the scanning transmission electron microscope is problematic due to scan coil hysteresis - the mismatch between the actual and assumed location of the electron probe beam as a function of the history of the scan. Hyst
Externí odkaz:
http://arxiv.org/abs/2307.08441
Autor:
Robinson, Alex W., Moshtaghpour, Amirafshar, Wells, Jack, Nicholls, Daniel, Broad, Zoe, Kirkland, Angus I., Mehdi, Beata L., Browning, Nigel D.
High quality scanning transmission electron microscopy (STEM) data acquisition and analysis has become increasingly important due to the commercial demand for investigating the properties of complex materials such as battery cathodes; however, multid
Externí odkaz:
http://arxiv.org/abs/2307.06138
Autor:
Nicholls, Daniel, Wells, Jack, Robinson, Alex W., Moshtaghpour, Amirafshar, Kobylynska, Maryna, Fleck, Roland A., Kirkland, Angus I., Browning, Nigel D.
Cryo Focused Ion-Beam Scanning Electron Microscopy (cryo FIB-SEM) enables three-dimensional and nanoscale imaging of biological specimens via a slice and view mechanism. The FIB-SEM experiments are, however, limited by a slow (typically, several hour
Externí odkaz:
http://arxiv.org/abs/2211.03494
Autor:
Robinson, Alex W., Nicholls, Daniel, Wells, Jack, Moshtaghpour, Amirafshar, Kirkland, Angus I., Browning, Nigel D.
Recently it has been shown that precise dose control and an increase in the overall acquisition speed of atomic resolution scanning transmission electron microscope (STEM) images can be achieved by acquiring only a small fraction of the pixels in the
Externí odkaz:
http://arxiv.org/abs/2207.10984