Výsledky vyhledávání - "Broué, Adrien"

Dissertation/ Thesis

Analyse multi-physique des sources de défiabilisation du microcontact ohmique dans les interrupteurs MEMS

Autor: Broué, Adrien

Les micro- et nanotechnologies (MNT) connaissent aujourd'hui un essor important dans des domaines très variés. On observe en particulier un développement des filières de micro-interrupteurs. En effet, les interrupteurs MEMS ont démontré un gain

Externí odkaz: http://tel.archives-ouvertes.fr/tel-00862813
http://tel.archives-ouvertes.fr/docs/00/86/28/13/PDF/THESE_-_A_BrouA_.pdf

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Akademický článek

Fostering Innovation in Diversified Business Groups with the Creation of Cross-Subsidiary Collaborative Structures.

Autor: Sandford, Arava, Jean, Camille, Mantelet, Fabrice, Broué, Adrien, Le Coq, Marc

Publikováno v: International Journal of Innovation & Technology Management; Jun2022, Vol. 19 Issue 4, p1-28, 28p

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Multi-physical characterization of micro-contact materials for MEMS switches

Autor: Broué, Adrien, Dhennin, J., Charvet, Pierre-Louis, Pons, Patrick, Ben Jemaa, N., Coccetti, Fabio, Plana, Robert

Publikováno v: Proceedings of 56th IEEE Holm Conference on Electrical Contacts
56th IEEE Holm Conference on Electrical Contacts
56th IEEE Holm Conference on Electrical Contacts, Oct 2010, Charleston, United States. 10 p

International audience; A systematic comparison between several pairs of contact materials based on an innovative methodology early developed at NOVA MEMS is hereby presented. The technique exploits a commercial nanoindenter coupled with electrical m

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::913521ae64553b65061cf5c937049f33
https://hal.science/hal-00670153/document

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Miniature RF MEMS switched Capacitors using Nanogaps to achieve 50ns switching Speed Capabilities

Autor: Pothier, Arnaud, Verger, Aurélie, Guines, Cyril, Crunteanu, Aurelian, Blondy, Pierre, Orlianges, Jean-Christophe, Dhennin, Jérémy, Broué, Adrien, Courtade, Frédéric, Vendier, Olivier

Publikováno v: ESA Round Table on Micro and Nano Technology
ESA Round Table on Micro and Nano Technology, Sep 2010, Noordwijk, Netherlands

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3dccba4ed48c8d8c1ae8eebf3051207b
https://hal-unilim.archives-ouvertes.fr/hal-00933632

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VALIDATION OF BENDING TEST BY NANOINDENTATION FOR MICRO-CONTACT ANALYSIS OF RF-MEMS SWITCHES

Autor: Broué, Adrien, Fourcade, Thibaut, Dhennin, Jérémie, Courtade, Frédéric, Dieppedale, Christel, Pons, Patrick, Lafontan, Xavier, Plana, Robert

Publikováno v: Proceeding of Micromechanics Europe Conference 2009
Micromechanics Europe Conference 2009
Micromechanics Europe Conference 2009, Sep 2009, Toulouse, France. 4 p

International audience; This paper demonstrates the validity of a new methodology using a commercial nanoindenter coupled with electrical measurement on test vehicles specially designed to investigate the micro-scale contact physics. Dedicated valida

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3f46c0f45797c04871dabc276fe66fa5
https://hal.science/hal-00670198/file/Updated_paper_MME2009.pdf

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RF MEMS electrical contact resistance calculation using mechanical contact simulations and analytical models

Autor: Pennec, Fabienne, Peyrou, David, Broué, Adrien, Dhennin, Jérémie, Pons, Patrick, Plana, Robert, Courtade, Fréderic

Publikováno v: International Collaborative Aerospace Development Micro Nanotechnologies: From concepts to systems (CANEUS 2009)
International Collaborative Aerospace Development Micro Nanotechnologies: From concepts to systems (CANEUS 2009), Mar 2009, Moffett Field (USA), United States

The testing and development of contact material or topology can be addressed with a dedicated experimental set up for monitoring test structures. However, it is difficult to perform the tests under realistic conditions. Moreover several works have al

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::90ca224e4adb166b01a34e742a92cc1d
https://hal.science/hal-00431027/document

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Contact Modeling of DC Contact RF MEMS for Investigation of the Microcontact Degradation Mechanism

Autor: Pennec, Fabienne, Peyrou, David, Dhennin, Jérémie, Broué, Adrien, Achkar, Hikmat, Pons, Patrick, Courtade, Frédéric, Plana, Robert

Publikováno v: 6th ESA Round Table on Micro & Nano Technologies for Space Applications ESA/ESTEC
6th ESA Round Table on Micro & Nano Technologies for Space Applications ESA/ESTEC, Oct 2007, Noordwijk, Netherlands

RF MEMS devices have already demonstrated very attractive performances to introduce some intelligence in the front end architectures. The insertion of RF MEMS into real architecture will necessitate reduced actuation voltage, dimensions and a better

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::0e033bf97a3c9c4074cc9d30c9147c47
https://hal.archives-ouvertes.fr/hal-00395370

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