Anodization and Microcontact Printing on Electroless Silver: Solution-Based Fabrication Procedures for Low-Voltage Electronic Systems with Organic Active Components

Autor: Wenjie Li, Christopher D. W. Jones, Richard E. Slusher, Donald W. Murphy, John A. Rogers, Zhenan Bao, Jennifer A. Tate, and Ananth Dodabalapur, Howard E. Katz, Brijesh Vyas

Publikováno v: Langmuir. 16:6054-6060

This communication demonstrates the combined use of two techniques for fabricating transistors that incorporate an organic semiconductor and that can operate at low voltages: anodization for thin (∼50 nm), high-capacitance gate dielectrics and micr

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::78387388617e821f88f7f1f1458dea9f
https://doi.org/10.1021/la991646b

The cavitation erosion-corrosion of stainless steel

Autor: Brijesh Vyas, Inge L.H. Hansson

Publikováno v: Corrosion Science. 30:761-770

The effect of cavitation erosion on the corrosion of stainless steel under active and passive condition has been studied. In addition, the effect of cavitation erosion on localized corrosion, such as pitting and intergranular corrosion has also been

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cd97eee59f2437b4e14b7f714b96b7b0
https://doi.org/10.1016/0010-938x(90)90001-l

Environmental factors influencing stress corrosion cracking in boiling water reactors

Autor: Hugh S. Isaacs, Brijesh Vyas, John R. Weeks

Publikováno v: Corrosion Science. 25:757-768

The mechanisms of intergranular stress corrosion cracking (I.G.S.C.C.) of sensitized stainless steels in boiling water reactor (BWR) primary coolant are reviewed, with emphasis on the role the environment plays on both the initiation and propagation

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::77b78421dbd96082f8d3b8fdede739ec
https://doi.org/10.1016/0010-938x(85)90009-5

Authors

Autor: C. N. Spalaris, P. J. Ring, E. A. Wright, J. Vrijen, J. K. van Westenbrugge, L. van der Wiel, P. L. F. Rademakers, C. P. Scheepens, J. W. Schinkel, Prodyot Roy, C. E. Sessions, S. D. Reynolds, M. A. Hebbar, J. F. Lewis, J. H. Kiefer, C. F. Uber, G. R. Kirkland, E. R. Davies, M. E. Lambert, E. J. Kennett, A. A. Tavassoli, H. Touron, M. Weisz, H. J. Connors, D. S. Wood, J. L. Simpson, M. N. Robles, S. A. Moss, P. V. Balakrishnan, P. McSweeney, C. R. Frost, P. Walmsley, G. Van Drunen, V. S. Cecco, R. H. Renshaw, S. Roy, T. S. Bulischeck, D. van Rooyen, M. Kowaka, H. Nagano, T. Kudo, Y. Okada, M. Yagi, O. Takaba, T. Yonezawa, K. Arioka, C. R. Wolfe, J. N. Esposito, D. D. Whyte, J. M. Gilkison, J. R. Balavage, M. J. Wootten, S. M. Wozniak, R. H. Emanuelson, D. F. Levstek, K. E. Moore, G. J. Theus, G. P. Airey, A. R. Vaia, R. G. Aspden, P. Hurst, H. C. Cowen, Michael W. J. Lewis, Charles S. Campbell, Kunihiko Satoh, Masao Toyoda, Shigetomo Matsui, Eisuke Mori, Shigeki Shimizu, Keisuke Satoh, S. G. Druce, B. C. Edwards, J. W. Martin, D. E. J. Talbot, B. Mukherjee, M. H. El Haddad, M. L. Vanderglas, D. V. Leemans, James Brown, Francisco Gonzalez, David Iley, Alexandra McKay, Brijesh Vyas, Carl J. Czajkowski, John R. Weeks

Publikováno v: Nuclear Technology. 55:229-241

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2a74d4fbb1b3eea44b560ce174a4740e
https://doi.org/10.13182/nt55-229

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