Zobrazeno 1 - 10
of 225 438
pro vyhledávání: '"Bright-field"'
Autor:
Sulejman, Shaban B., Wesemann, Lukas, McCormack, Mikkaela, Meng, Jiajun, Hutchison, James A., Priscilla, Niken, McColl, Gawain, Read, Katrina, Sim, Wilson, Sukhorukov, Andrey A., Crozier, Kenneth B., Roberts, Ann
Different imaging modalities are used to extract the diverse information carried in an optical field. Two prominent modalities include bright field and phase contrast microscopy that can visualize the amplitude and phase features of a sample, respect
Externí odkaz:
http://arxiv.org/abs/2406.04576
Autor:
Fan, Yudong a, 1, Du, Yanli a, 1, Zhao, Nan b, Tian, Yongzhi a, Cheng, Liwen c, Hu, Yongsheng a, Ma, Fengying a, ⁎, He, Jiuru a, ⁎
Publikováno v:
In Optics and Lasers in Engineering March 2025 186
Autor:
Raufeisen, Johannes, Xie, Kunpeng, Hörst, Fabian, Braunschweig, Till, Li, Jianning, Kleesiek, Jens, Röhrig, Rainer, Egger, Jan, Leibe, Bastian, Hölzle, Frank, Hermans, Alexander, Puladi, Behrus
Background: Cell segmentation in bright-field histological slides is a crucial topic in medical image analysis. Having access to accurate segmentation allows researchers to examine the relationship between cellular morphology and clinical observation
Externí odkaz:
http://arxiv.org/abs/2401.15638
It is generally assumed that a high spatial resolution of a microscope requires a large numerical aperture of the imaging lens or detector. In this study, the information limit of 15 pm is achieved in transmission electron microscopy using only the b
Externí odkaz:
http://arxiv.org/abs/2401.02439
Autor:
Patrick, Matthew J., Eckstein, James K., Lopez, Javier R., Toderas, Silvia, Asher, Sarah A., Whang, Sylvia I., Levine, Stacey, Rickman, Jeffrey M., Barmak, Katayun
Publikováno v:
Microsc Microanal 00 2023 1-12
Quantification of microstructures is crucial for understanding processing-structure and structure-property relationships in polycrystalline materials. Delineating grain boundaries in bright-field transmission electron micrographs, however, is challen
Externí odkaz:
http://arxiv.org/abs/2312.09392
Autor:
Zhang, Pengcheng, Zhan, Tingting, Gu, Guoqiang, Li, Changle, Lyu, Mengting, Zhang, Yi, Yang, Hui
Scattering-based single-particle tracking (S-SPT) has opened new avenues for highly sensitive label-free detection and characterization of nanoscopic objects, making it particularly attractive for various analytical applications. However, a long-stan
Externí odkaz:
http://arxiv.org/abs/2311.11506
Publikováno v:
In Colloids and Surfaces A: Physicochemical and Engineering Aspects 20 March 2025 709 Part 1
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Akademický článek
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