Multifunctional light beam source for surface slope measuring long trace profilers

Autor: Ian Lacey, Kevan Anderson, Jeff Dickert, Péter Takács, Brian V. Smith, Valeriy V. Yashchuk

Publikováno v: Advances in Metrology for X-Ray and EUV Optics IX.

To fully exploit the advantages of fourth-generation synchrotron light sources, diffraction-limited-storage-rings (DLSR) and fully coherent free electron lasers (FELs), beamline mirrors and diffraction grating must be of exceptional quality. To achie

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::776efaa92d38f959e188929a2125aef5
https://doi.org/10.1117/12.2570462

Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometers

Autor: Ralf D Geckler, Brian V. Smith, Andreas Just, Frank Siewert, Valeriy V. Yashchuk, Ian Lacey, Thomas Arnold, Hendrik Paetzelt

Publikováno v: Lacey, Ian; Geckler, Ralf D; Just, Andreas; Siewert, Frank; Arnold, Thomas; Paetzelt, Hendrik; et al.(2019). Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometers.. The Review of scientific instruments, 90(2), 021717. doi: 10.1063/1.5058710. Lawrence Berkeley National Laboratory: Retrieved from: http://www.escholarship.org/uc/item/3jt1v2n5
The Review of scientific instruments, vol 90, iss 2

Deflectometric profilometers based on industrial electronic autocollimators (ACs), as the ELCOMAT-3000, have become indispensable tools for precision form measurements of optical surfaces. A growing number of labs at synchrotron and free electron las

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f7cc31fb754740c58600dbcc8c61e24
http://www.escholarship.org/uc/item/3jt1v2n5

The ALS OSMS: Optical Surface Measuring System for high accuracy two-dimensional slope metrology with state-of-the-art x-ray mirrors

Autor: Kevan Anderson, Brian V. Smith, Theo Nicolot, Gevork S. Gevorkyan, Valeriy V. Yashchuk, Ian Lacey, Gary Centers, Andreas Just, John Grossiord, Ralf D. Geckeler

To preserve the brightness and coherence of x-rays produced by diffraction-limited-storage-ring (DLSR) and free-electron- laser (FEL) light sources, beamline optics must have unprecedented quality. For example, in the case of the most advanced beamli

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44db6795d1c1b291b2161783bedddc71
https://escholarship.org/uc/item/8560v7c3

X-ray optics laboratory at the ALS: current capabilities, new challenges, and tasks for further development (Conference Presentation)

Autor: Gevork S. Gevorkyan, Anand Asundi, Gary Centers, Ian Lacey, Sergey M. Nikitin, Haruhiko Ohashi, Valeriy V. Yashchuk, Lahsen Assoufid, Brian V. Smith

Publikováno v: Advances in Metrology for X-Ray and EUV Optics VII.

The R&D work on the ALS upgrade to a diffraction limited electron ring, ALS-U, has brought to focus the need for near-perfect x-ray optics, capable of delivering light to experiments without significant degradation of brightness and coherence. The de

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2fa12135a6c63dcb89d797b67b4567b4
https://doi.org/10.1117/12.2275565

Ex situ metrology and data analysis for optimization of beamline performance of aspherical pre-shaped x-ray mirrors at the advanced light source

Autor: Wayne R. McKinney, Gevork S. Gevorkyan, Brian V. Smith, Valeriy V. Yashchuk, Tony Warwick, Ian Lacey

Publikováno v: Review of Scientific Instruments. 90:021711

Super high quality aspherical x-ray mirrors with a residual slope error of ∼100 nrad (root-mean-square) and a height error of ∼1-2 nm (peak-to-valley), and even lower, are now available from a number of the most advanced vendors utilizing determi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8f02c9cffa01e794a4f81107065b4eac
https://doi.org/10.1063/1.5057441