Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Brian L. Olmsted"'
Publikováno v:
Cockpit Displays VI: Displays for Defense Applications.
Avionic engineers are increasingly replacing CRTs with LCDs in both head-up displays and head down displays. Indeed, LCDs have made considerable progress with regards to adequate brightness, dimmability and reliability. Image quality issues in terms
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58d1fb4d339d0bb4170fb1a9873c5f3b
https://doi.org/10.1117/12.357603
https://doi.org/10.1117/12.357603
Publikováno v:
SPIE Proceedings.
In this paper we will outline the theoretical and practical advantages of projection displays based on resonant microcavities. We will present results recently obtained for Eu:Y 2 O 3 activated microcavities, compare them with theoretical models and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f1b88acb6e7e0dc8a33022db999f730
https://doi.org/10.1117/12.276991
https://doi.org/10.1117/12.276991
Autor:
Brian L. Olmsted, Michieal L. Jones
Publikováno v:
Modern Spectroscopy of Solids, Liquids, and Gases.
Spectroscopy is often performed on emission or absorption centers that due to sample preparation are located within a thin film or located in proximity to a dielectric interface. However, locating emission or absorption centers near reflecting interf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4f9996f1aa690c7025637ebed0c11b0c
https://doi.org/10.1364/msslg.1995.sthb11
https://doi.org/10.1364/msslg.1995.sthb11
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 9:2244
We report a direct optical observation of process‐specific diffusion‐related deep levels associated with interdiffusion in AlGaAs/GaAs superlattice structures. We have used low‐energy cathodoluminescence spectroscopy (CLS) to investigate the fo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::07021c1d0392d53f3792b0595cbef901
https://doi.org/10.1116/1.585728
https://doi.org/10.1116/1.585728
Conference
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