Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Brian J. Roche"'
Autor:
Beth Coviello, Christine P. Chen, David Fisher, Brian J. Roche, Douglas H. Wilson, Yutaka Sadohara, Matt Brown, Tatiana Berdinskikh
Publikováno v:
National Fiber Optic Engineers Conference.
This research is to establish a modeling methodology to assess insertion loss due to contamination on a lens based, 10Gb/s, short reach Small Form-factor Pluggable (SFP+) module transceivers in multimode applications.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::68a8110ba9bb3fc07e20fd79b5720598
https://doi.org/10.1364/nfoec.2010.jtha56
https://doi.org/10.1364/nfoec.2010.jtha56
Autor:
Sun-Yuan Huang, Tom Mitcheltree, Michael Hughes, David Fisher, Douglas H. Wilson, Brian J. Roche, Matt Brown, Tatiana Berdinskikh, Steve Lytle
Publikováno v:
SPIE Proceedings.
This paper summarizes the correlation study between contamination and scratches on singlemode APC connectors and signal degradation; leading to an Acceptance Criteria Matrix. The study is a continuation of International Electronics Manufacturing Init
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::094b83981bb4d1f827eb3e447bb22386
https://doi.org/10.1117/12.837545
https://doi.org/10.1117/12.837545
Autor:
David Fisher, Christine Chen, Tatiana Berdinskikh, Douglas H. Wilson, Beth Coviello, Brian J. Roche, Yutaka Sadohara, Sun-Yuan Huang
Publikováno v:
Optical Fiber Communication Conference and National Fiber Optic Engineers Conference.
Developed optical modeling for prediction of contamination effects on optical properties of lens-based receptacles. Good correlation between experimental and modeling data was demonstrated for lens-based SFP modules.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e1581c9097a0399c6d367985e2f5254
https://doi.org/10.1364/nfoec.2009.jtha86
https://doi.org/10.1364/nfoec.2009.jtha86
Autor:
Mike Hughes, Tatiana Berdinskikh, David Fisher, Sun-Yuan Huang, Tom Mitcheltree, Heather Tkalec, Aron Lau, Steve Lytle, Brian J. Roche, Douglas H. Wilson
Publikováno v:
OFC/NFOEC 2008 - 2008 Conference on Optical Fiber Communication/National Fiber Optic Engineers Conference.
This paper summarizes the latest research of iNEMI (International Electronics Manufacturing Initiative) on development of cleanliness specification for single-mode angle physical contact MT fiber optics connectors. The acceptance criteria matrix for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6d2941e65a31e50127f509c8e219cf98
https://doi.org/10.1109/ofc.2008.4528283
https://doi.org/10.1109/ofc.2008.4528283
Autor:
David Fisher, Tatiana Berdinskikh, Sun-Yuan Huang, Douglas H. Wilson, H. Tkalec, S.B. Ainley, Jeno Chen, Brian J. Roche, J.M. Culbert
Publikováno v:
OFC/NFOEC 2007 - 2007 Conference on Optical Fiber Communication and the National Fiber Optic Engineers Conference.
The increased accumulation of particles near the core during a series of mating/de-mating operations was investigated. One cause for this accumulation was ESD (electrostatic discharge) effects from cleaning. Methods to prevent this phenomenon were st
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44dcf68aef3d303c93abe9abd5bde4bb
https://doi.org/10.1109/ofc.2007.4348496
https://doi.org/10.1109/ofc.2007.4348496
Autor:
Steve Lytle, Douglas H. Wilson, Brian J. Roche, F. Zhang, C. Gleason, J. Kilmer, Sun-Yuan Huang, Tatiana Berdinskikh, J. Garcia, A. Ho, Tom Mitcheltree, H. Tkalec
Publikováno v:
2006 Optical Fiber Communication Conference and the National Fiber Optic Engineers Conference.
Contaminated optical connectors result in degradation of optical performance, functional failures, and increased deployment costs. Currently there is no widely accepted cleanliness standard based on a systematic study of the impact of cleanliness on
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::da412d24531aff44d2d4aff1ff70a25f
https://doi.org/10.1109/ofc.2006.215866
https://doi.org/10.1109/ofc.2006.215866
Autor:
Thomas Mitcheltree, Wayne Lootsma, Brian J. Roche, Mike Lewandowski, John Duffy, Douglas H. Wilson, Rémy Trotabas
Publikováno v:
International Symposium for Testing and Failure Analysis.
This paper discusses the requirements, challenges, and capabilities of a fully automated visual inspection tool (AVIT) designed to improve the evaluation of fiber optic endfaces. The FiberQA™-AVIT system is based on the FiberQA™-EFI (Endface Insp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::39940a860b94e7c39ce21cacfd8644d0
https://doi.org/10.31399/asm.cp.istfa2004p0302
https://doi.org/10.31399/asm.cp.istfa2004p0302