Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Brian D. Maxwell"'
Autor:
Parker G. Allan, Robert G. Briggs, Andrew K. Conner, Christen M. O'Neal, Phillip A. Bonney, Brian D. Maxwell, Cordell M. Baker, Joshua D. Burks, Goksel Sali, Chad A. Glenn, Michael E. Sughrue
Publikováno v:
Brain and Behavior, Vol 9, Iss 10, Pp n/a-n/a (2019)
Abstract Introduction The dorsal attention network (DAN) is an important mediator of goal‐directed attentional processing. Multiple cortical areas, such as the frontal eye fields, intraparietal sulcus, superior parietal lobule, and visual cortex, h
Externí odkaz:
https://doaj.org/article/7a85a10fa9454c128080b517f2957c41
Autor:
Andrew K. Conner, Robert G. Briggs, Brian D. Maxwell, Cordell M Baker, Chad A. Glenn, Parker G. Allan, Christen M. O'Neal, Joshua D. Burks, Michael E. Sughrue, Goksel Sali, Phillip A. Bonney
Publikováno v:
Brain and Behavior, Vol 9, Iss 10, Pp n/a-n/a (2019)
Brain and Behavior
Brain and Behavior
Introduction The dorsal attention network (DAN) is an important mediator of goal‐directed attentional processing. Multiple cortical areas, such as the frontal eye fields, intraparietal sulcus, superior parietal lobule, and visual cortex, have been
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::207e5dd3d2a8979941a242d67cba7d98
https://doaj.org/article/7a85a10fa9454c128080b517f2957c41
https://doaj.org/article/7a85a10fa9454c128080b517f2957c41
Autor:
Brian D. Maxwell, Sean B. Andersson
Publikováno v:
ACC
This work develops a novel sensing matrix for the application of compressed sensing (CS) to image acquisition in atomic force microscopy (AFM), with the goal of improving the temporal resolution of the instrument by reducing the amount of data that n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7b99d1fef297feab2f8f86ce47c2b3fa
https://doi.org/10.1109/acc.2014.6858710
https://doi.org/10.1109/acc.2014.6858710
Autor:
Brian D. Maxwell, Sean B. Andersson
Publikováno v:
Biophysical Journal. (2):798a
The Atomic Force Microscope (AFM) is a powerful tool that has had a tremendous impact on the understanding of systems with nanometer-scale features. Efforts in improving the temporal resolution of the instrument have recently yielded high-speed AFMs
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c7f84293bbbcbf5bb91ff636b2e9b9c2