What are the critical issues for SOI ?

Autor: Cristoloveanu, S., Colinge, J.-P., Faynot, O., Claeys, C., Okhonin, S., Bretegnier, D.

Publikováno v: Invited paper, panel session, 4th EUROSOI Workshop, Cork, Ireland
Invited paper, panel session, 4th EUROSOI Workshop, Cork, Ireland, Jan 2008,-, France

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4c875f818fe0878d6ec426fdec4f3401
https://hal.archives-ouvertes.fr/hal-00392052

On the impact of Ag doping on performance and reliability of GeS2-based Conductive Bridge Memories.

Autor: Vianello, E., Cagli, C., Molas, G., Souchier, E., Blaise, P., Carabasse, C., Rodriguez, G., Jousseaume, V., De Salvo, B., Longnos, F., Dahmani, F., Verrier, P., Bretegnier, D., Liebault, J.

Publikováno v: 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC); 1/ 1/2012, p278-281, 4p

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On the impact of Ag doping on performance and reliability of GeS2-based conductive bridge memories.

Autor: Longnos, F.¹ florian.longnos@cea.fr, Vianello, E.², Cagli, C.², Molas, G.², Souchier, E.², Blaise, P.², Carabasse, C.², Rodriguez, G.², Jousseaume, V.², De Salvo, B.², Dahmani, F.¹, Verrier, P.¹, Bretegnier, D.¹, Liebault, J.¹

Publikováno v: Solid-State Electronics. Jun2013, Vol. 84, p155-159. 5p.