Zobrazeno 1 - 10
of 46
pro vyhledávání: '"Bratus', V.Ya."'
Autor:
Lemishko, S.V., Vorona, I.P., Yukhymchuk, V.O., Bratus', V.Ya., Okulov, S.M., Nosenko, V.V., Solopan, S.O., Belous, A.G.
Publikováno v:
In Thin Solid Films 1 March 2023 768
Publikováno v:
In Physica B: Physics of Condensed Matter 15 December 2009 404(23-24):4739-4741
Publikováno v:
In Physica B: Physics of Condensed Matter 2001 308:637-640
Autor:
Bratus, V.Ya. *, Makeeva, I.N., Okulov, S.M., Petrenko, T.L., Petrenko, T.T., von Bardeleben, H.J.
Publikováno v:
In Physica B: Physics of Condensed Matter 2001 308:621-624
Publikováno v:
In Applied Surface Science 2001 184(1):229-236
Publikováno v:
In Applied Surface Science 2001 184(1):273-277
A careful study of neutron-irradiated cubic SiC crystals (3С-SiC(n)) has been performed using electron paramagnetic resonance (EPR) in the course of their thermal annealing within the 200…1100 °C temperature range. Several inherent temperatures h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::a027d88a69475bcb6179fc17f90c374f
http://dspace.nbuv.gov.ua/handle/123456789/121255
http://dspace.nbuv.gov.ua/handle/123456789/121255
Autor:
Dan’ko, V.A., Bratus, V.Ya., Indutnyi, I.Z., Lisovskyy, I.P., Zlobin, S.O., Michailovska, K.V., Shepeliavyi, P.E.
The effect of HF and H₂O₂ vapor treatment on the spectral composition and intensity of photoluminescence (PL) in porous oblique deposited nc-Si–SiOx structures have been studied using FTIR, electron-spin resonance (EPR) and PL measurements. As
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______1456::ab51c5cc650444e92442af5021cf833b
http://dspace.nbuv.gov.ua/handle/123456789/118561
http://dspace.nbuv.gov.ua/handle/123456789/118561
Autor:
Bratus, V.Ya., Makeeva, I.N., Okulov, S.M., Petrenko, T.L., Petrenko, T.T., von Bardeleben, Hans Jürgen
Publikováno v:
Materials Science Forum; January 2001, Vol. 353 Issue: 1 p517-520, 4p
Autor:
Kalinina, Evgenia V., Zubrilov, A.S., Kuznetsov, N.I., Nikitina, Irina P., Tregubova, A.S., Shcheglov, M.P., Bratus, V.Ya.
Publikováno v:
Materials Science Forum; May 2000, Vol. 338 Issue: 1 p497-500, 4p