Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Brasil, Miguel Augusto Bauermann"'
Publikováno v:
Repositório Institucional da UFSMUniversidade Federal de Santa MariaUFSM.
There isn t a unique development process suitable for all software projects. Standards and quality models such as ISO/IEC 15504, MPS.BR, CMM and CMMI, recommend the process tailoring to satisfy specific project features. However process tailoring is
Externí odkaz:
http://repositorio.ufsm.br/handle/1/5442
Publikováno v:
Biblioteca Digital de Teses e Dissertações do UFSM
Universidade Federal de Santa Maria (UFSM)
instacron:UFSM
Universidade Federal de Santa Maria (UFSM)
instacron:UFSM
There isn t a unique development process suitable for all software projects. Standards and quality models such as ISO/IEC 15504, MPS.BR, CMM and CMMI, recommend the process tailoring to satisfy specific project features. However process tailoring is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3056::87acb664f8ef47c9e2b38934304c4b10
http://repositorio.ufsm.br/handle/1/5442
http://repositorio.ufsm.br/handle/1/5442
Autor:
Brasil, Miguel Augusto Bauermann, Bosch, Bernhard, Wagner, Flavio Rech, de Freitas, Edison Pignaton
Publikováno v:
IEEE Sensors Journal; 4/1/2018, Vol. 18 Issue 7, p3039-3049, 11p
Autor:
Nietsche EA; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil., Cassenote LG; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil., Salbego C; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil., Ramos TK; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil., Perlini NMOG; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil., Böck A; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil., Brasil MAB; Universidade Federal de Santa Maria. Santa Maria, Rio Grande do Sul, Brazil.
Publikováno v:
Revista brasileira de enfermagem [Rev Bras Enferm] 2020 Dec 21; Vol. 73 (suppl 6), pp. e20190741. Date of Electronic Publication: 2020 Dec 21 (Print Publication: 2020).