Zobrazeno 1 - 1
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pro vyhledávání: '"Bram Van der Streeck"'
Autor:
Bart Boesman, Davy Pissoort, Tom Dhaene, Dirk Deschrijver, Filip Vanhee, Bram Van der Streeck, Ivo Couckuyt
Publikováno v:
The International Symposium on Electromagnetic Compatibility, Proceedings
In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bb73522b750e43703b375df9e7c84afe
https://doi.org/10.1109/emceurope.2012.6396676
https://doi.org/10.1109/emceurope.2012.6396676
