Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Bradley N. Damazo"'
Autor:
Bradley N. Damazo, András E. Vladár
Publikováno v:
Microscopy and Microanalysis. 25:244-245
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44d88db15734c2fb6897bbd2f890e058
https://doi.org/10.1017/s1431927619001958
https://doi.org/10.1017/s1431927619001958
Publikováno v:
SPIE Proceedings.
The future of our nation hinges on our ability to prepare our next generation to be innovators in science, technology, engineering and math (STEM). Excitement for STEM must begin at the earliest stages of our education process. Yet, today far too few
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3800690b950d0c50802a8a96e5974f0
https://doi.org/10.1117/12.2183085
https://doi.org/10.1117/12.2183085
Publikováno v:
SPIE Proceedings.
A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::878fad000119512202f20710c29e7374
https://doi.org/10.1117/12.918263
https://doi.org/10.1117/12.918263
Autor:
Eranga C. Jayewardene, Michael T. Postek, Bradley N. Damazo, András E. Vladár, William J. Keery
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XVIII.
The National Institute of Standards and Technology (NIST) has implemented a high bandwidth laser interferometer measurement system in a specialized metrology microscope. The purpose of the system is the certification of SEM magnification calibration
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b723716ef652f2a54f2e127e27fec02
https://doi.org/10.1117/12.537502
https://doi.org/10.1117/12.537502
Autor:
Theodore V. Vorburger, Clayton Teague, John Song, Nicholas G. Dagalakis, E Amatucci, John Evans, Bradley N. Damazo, Matthew A. Davies
Publikováno v:
Nanotribology ISBN: 9781461353560
The future of nano-, micro- and meso-scale manufacturing operations will be strongly influenced by a new breed of assembly and manufacturing tools that will be intelligent, flexible, more precise, include in-process production technologies and make u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f05925d42bdb1340e7bd9bdb03de09bb
https://doi.org/10.1007/978-1-4615-1023-9_21
https://doi.org/10.1007/978-1-4615-1023-9_21
Autor:
Bradley N. Damazo, Michael T. Postek, Eranga C. Jayewardene, William J. Keery, András E. Vladár
Publikováno v:
SPIE Proceedings.
The National Institute of Standards and Technology (NIST) has provided industry with a scanning electron microscope (SEM) magnification calibration sample Reference Material (RM) 8090. The certified, Standard Reference Material (SRM) version, SRM 209
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d30923e23d4ecf5ca30c42faba0d1b2
https://doi.org/10.1117/12.473445
https://doi.org/10.1117/12.473445
Autor:
Michael T. Postek, András E. Vladár, Alice V. Ling, Bradley N. Damazo, Eranga C. Jayewardene, M. Alkan Donmez
Publikováno v:
SPIE Proceedings.
This paper describes the design and implementation of a system for monitoring the performance of several major subsystems of a critical dimension measurement scanning electron microscope (CD-SEM). Experiments were performed for tests involving diagno
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f89184a8bf994b828efec762309d758f
https://doi.org/10.1117/12.436805
https://doi.org/10.1117/12.436805
Publikováno v:
International Journal of Mechatronics and Manufacturing Systems. 2:600
The small work volumes of Micro/Meso-scale Machine Tools (MMMTs) often present problems for calibration and error compensation, but also allow solutions not practical on the traditional scale. Measuring tool position with a separate metrology frame a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24f194aad62f65fd6736fde6f3b2a840
https://doi.org/10.1504/ijmms.2009.028083
https://doi.org/10.1504/ijmms.2009.028083
Autor:
H. Zou, Bradley N. Damazo, Satoshi Gonda, Carsten P. Jensen, Richard M. Silver, Jau-Shi Jay Jun, Lowell P. Howard
Publikováno v:
Optical Engineering. 43:79
We develop a new implementation of a Michelson interferometer designed to make measurements with an uncertainty of less than 20 pm. This new method uses a tunable diode laser as the light source, with the diode laser wavelength continuously tuned to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df8e3bd1f9399a4826ff21087b44619d
https://doi.org/10.1117/1.1631002
https://doi.org/10.1117/1.1631002