Zobrazeno 1 - 10
of 12
pro vyhledávání: '"Bradley M. Melnick"'
Autor:
Mark H. Engelhard, S. He, R. L. Hance, Bradley M. Melnick, P. Alluri, Alan S. Lea, J. Finder, Y. Gao
Publikováno v:
Scopus-Elsevier
(Ba, Sr)TiO3 (BST) thin films have been grown on planar Ir/Si and Pt/Si substrates and on three-dimensional (3D) Ir electrodes by metalorganic chemical vapor deposition using two kinds of β-diketonate-based BST precursors. Film growth was studied as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1263a678a65d28515b6a35a7d29eec58
https://doi.org/10.1063/1.371833
https://doi.org/10.1063/1.371833
Autor:
Koji Arita, Sufi Zafar, Yasuhiro Shimada, Bruce E. White, Bo Jiang, D. J. Taylor, M. Azuma, Robert E. Jones, H. Hirano, J. Nakane, Yasuhiro Uemoto, D. Price, T. Nakakum, Tatsuo Otsuki, Peter Zurcher, S.J. Gillespie, Bradley M. Melnick, Yuji Judai, Eiji Fujii, G. Kano, S. Hayashi, Nobuyuki Moriwaki, Tatsumi Sumi, P.Y. Chu
Publikováno v:
Integrated Ferroelectrics. 17:21-30
Ferroelectric non-volatile memories (FENVM) are fabricated using spin-coat and fire deposition of the SrBi2Ta2O9 layered perovskite ferroelectric. Test memories using a 2 transistor-2 capacitor bit cell, top contacts to capacitors and single level me
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8e937c2764345eae855a0652eee4e9e4
https://doi.org/10.1080/10584589708012978
https://doi.org/10.1080/10584589708012978
Autor:
Carlos A. Paz De Araujo, Larry D. McMillan, Bradley. M. Melnick, Joseph D. Cuchiaro, James. F. Scott
Publikováno v:
Ferroelectrics. 104:241-256
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c5b2d3997e315918c87c35d78681e902
https://doi.org/10.1080/00150199008223827
https://doi.org/10.1080/00150199008223827
Autor:
Peter Zurcher, Bo Jiang, P.Y. Chu, Bradley M. Melnick, Wei Chen, D. J. Taylor, Sufi Zafar, S.J. Gillespie, Robert E. Jones, Bruce E. White, N. Cave
Publikováno v:
ISAF '96. Proceedings of the Tenth IEEE International Symposium on Applications of Ferroelectrics.
Effects of processing parameters and thickness on the properties of spin-on SrBi/sub 2/Ta/sub 2/O/sub 7/ (SET) films were investigated. Film crystallinity was improved with heat treatment but surface roughness also increased significantly above 400/s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3e9ef6d53a2eb4ef0977a98fbb01e9dc
https://doi.org/10.1109/isaf.1996.602760
https://doi.org/10.1109/isaf.1996.602760
Autor:
Alan S. Lea, S. He, Y. Gao, Mark H. Engelhard, P. Alluri, Bradley M. Melnick, R. L. Hance, J. Finder
Publikováno v:
MRS Proceedings. 541
Metalorganic chemical vapor deposition (MOCVD) has been used to grow (Ba,Sr)TiO3 thin films on Ir/SiO2/Si substrates. β-diketonates of Ba, Sr, and Ti were used as the precursors, and delivered to the reactor via direct-liquid injection. Growth rate
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3256ee07d89f2d8bb64fd18c27b59f8
https://doi.org/10.1557/proc-541-29
https://doi.org/10.1557/proc-541-29
Autor:
Tom Remmel, P. Alluri, Sufi Zafar, Clarence J. Tracy, Bruce E. White, Doug Roberts, Mark V. Raymond, T.-L. Tsai, P.Y. Chu, Bradley M. Melnick, S.J. Gillespie, Peter Zurcher, Robert E. Jones, M. Kim, Bo Jiang
Publikováno v:
MRS Proceedings. 541
Long recognized as the best potential solution to the continued scaling of the onetransistor/one-capacitor standalone dynamic random access memory (DRAM) beyond a gigabit, barium strontium titanate (BST) and other high permittivity dielectrics are fa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c53600567612817074cf182c540f6322
https://doi.org/10.1557/proc-541-11
https://doi.org/10.1557/proc-541-11
Autor:
Tom Remmel, Wei Chen, Peter Fejes, E. P. Ehlert, M. Kottke, L.-H. Chang, B. A. Baumert, Bradley M. Melnick, Clarence J. Tracy, T.-L. Tsai, D. F. Sullivan
Publikováno v:
MRS Proceedings. 493
Barium Strontium Titanate films have been deposited by rf magnetron sputtering and have been studied with respect to Ba/Sr ratio. Physical and electrical characterization has been done as a function of temperature, thickness, and composition, and res
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19670dc4f8deb7bb370894eeda0bb557
https://doi.org/10.1557/proc-493-21
https://doi.org/10.1557/proc-493-21
Autor:
Peir Y. Chu, D. J. Taylor, Bradley M. Melnick, Bruce E. White, Sufi Zafar, Bo Jiang, Robert E. Jones, D. Gentile, S.J. Gillespie, V. Balu, Peter Zurcher
Publikováno v:
MRS Proceedings. 493
The dielectric constant and dispersion of sputtered barium strontium titanate (BST) thin films deposited on Ir electrodes have been measured as a function of frequency and dielectric film thickness. Based on the measured variation in capacitance dens
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::600f572a04da8207b5549daf1c43e194
https://doi.org/10.1557/proc-493-165
https://doi.org/10.1557/proc-493-165
Autor:
David Gentile, Bradley M. Melnick, Bruce E. White, Tom Remmel, S.J. Gillespie, Bo Jiang, Robert E. Jones, Sufi Zafar, Peir Chu, Peter Zurcher, D. J. Taylor
Publikováno v:
MRS Proceedings. 493
The correlation between the dielectric constant and dispersion is investigated for barium strontium titanate (BST) capacitors with platinum and iridium electrodes. For platinum electrode capacitors, dispersion decreases with increasing dielectric con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d8f0257bc5c37c83fc245a453b9c0daf
https://doi.org/10.1557/proc-493-15
https://doi.org/10.1557/proc-493-15
Publikováno v:
Integrated Ferroelectrics. 16:xv-xvi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fac2e89ec54279852e5d1d64c973f145
https://doi.org/10.1080/10584589708013024
https://doi.org/10.1080/10584589708013024