Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Bradford Van Treuren"'
Publikováno v:
IEEE European Test Symposium (ETS 2021)
IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. ⟨10.1109/ETS50041.2021.9465438⟩
IEEELink
ETS
IEEE European Test Symposium (ETS 2021), May 2021, Bruges, Belgium. ⟨10.1109/ETS50041.2021.9465438⟩
IEEELink
ETS
International audience; The industry is moving forward with non-TAP, chip-level interfaces driving IEEE 1687-2014 networks. Recent literature not only describes such interfaces, like I 2 C and IEEE 1149.7 variants, but also demonstrates that such int
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1253dd372450e0c0b07e5f67a10835f0
https://hal.archives-ouvertes.fr/hal-03432437
https://hal.archives-ouvertes.fr/hal-03432437
Publikováno v:
2019 IEEE AUTOTESTCON.
Access to internal circuit nodes and elements from the system level improves test and diagnostic coverage. The traditional approach of tearing down a system in order to ascertain whether a subsystem, a circuit board or a component is in fact faulty i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16fbbcd4dda1191d7259a6bd3396fd51
https://doi.org/10.1109/autotestcon43700.2019.8961045
https://doi.org/10.1109/autotestcon43700.2019.8961045
Publikováno v:
2019 IEEE AUTOTESTCON.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c9aca2391b1cc90c937c2f76d08e373
https://doi.org/10.1109/autotestcon43700.2019.8961903
https://doi.org/10.1109/autotestcon43700.2019.8961903
Publikováno v:
IEEE Design & Test. 30:15-25
This article highlights the challenge of making dynamic IJTAG operational. While the PDL allows flexibility, it generates problems for the back-end, which is how IJTAG operations are combined and executed.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::78944fd6f61af46cce9c6da86be6f691
https://doi.org/10.1109/mdat.2013.2278541
https://doi.org/10.1109/mdat.2013.2278541
Publikováno v:
ITC
This paper presents the Open-Circuit Deadlock (OCD), a primitive that allows flexible and scalable securization of a JTAG target, from the cell to the system level.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4d34fe16f04046eff982e139ddfe8613
https://doi.org/10.1109/test.2010.5699300
https://doi.org/10.1109/test.2010.5699300
Publikováno v:
ITC
This paper presents the Test Instruction Set Architecture (TISA), an invention that can enable scalable interactive testing to leverage the experience of embedded computing. This approach is applied to an 1149.1 system, obtaining a processor able to
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04dd36bb8bdf66a2b1ee746ac1d31370
https://doi.org/10.1109/test.2009.5355811
https://doi.org/10.1109/test.2009.5355811