Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Brad Gifford"'
Publikováno v:
Microelectronics Reliability. 45:287-295
ICs that are robust to ESD at the component-level may be damaged by ESD at the board-level. Two case studies show that real-world Charged Board Model (CBM) ESD damage is typically more severe than Human Body Model (HBM) or Charged Device Model (CDM)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c62bd9c11bc58934223e50e7279cee66
https://doi.org/10.1016/j.microrel.2004.05.016
https://doi.org/10.1016/j.microrel.2004.05.016
