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pro vyhledávání: '"Bourouba, Farid"'
Autor:
Bourouba, Farid, Ouennoughi, Zahir
The race for miniaturization of integrated circuits causes the appearance of anumber of parasitics effects, from degrading the electricals characteristics of thedevices. These are the gate leakage increasing with the reduction of the dielectricthickn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______166::26d4dbcbec246cc2fe3b6b5ee36c81a0
https://theses.hal.science/tel-01774538
https://theses.hal.science/tel-01774538
Autor:
Bourouba, Farid, Ouennoughi, Zahir
The race for miniaturization of integrated circuits causes the appearance of anumber of parasitics effects, from degrading the electricals characteristics of thedevices. These are the gate leakage increasing with the reduction of the dielectricthickn
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______2592::26d4dbcbec246cc2fe3b6b5ee36c81a0
https://theses.hal.science/tel-01774538
https://theses.hal.science/tel-01774538