A Power Cycling Test Bench dedicated to the test of power modules in a large range of cycling frequency

Autor: Forest, François, Huselstein, Jean-Jacques, PELLECUER, Guillaume, Bontemps, Serge

Publikováno v: PCIM Europe 2017; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
PCIM Europe 2017, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management
PCIM Europe 2017, International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, 2017, Nuremberg, Germany

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::34046018ce0d704afc5bfe1d45a2a8e9
https://hal.archives-ouvertes.fr/hal-02005411/file/PCIM2017-Forest-PowerCyclingTest-Final.pdf

Procédé de frittage de pâte d'argent double face adapté aux composants silicium avec métallisation supérieure aluminium

Autor: Maxime, Barriere, Azzopardi, Stephane, Favre, Isabelle, Woirgard, Eric, Bontemps, Serge, Le Henaff, Francois

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______166::3a0e6e8aaf3b9c776927ba03ef20d5e1
https://hal.archives-ouvertes.fr/hal-01671856

Estimation of conductivity variation in multilayered structure of power semiconductor module using eddy current method

Autor: Nguyen, Tien Anh, Joubert, Pierre-Yves, Lefebvre, Stéphane, Bontemps, Serge

Publikováno v: EMSA2014 10th European Conference on Magnetic Sensors and Actuators
EMSA2014 10th European Conference on Magnetic Sensors and Actuators, Jul 2014, Vienna, Austria

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::d8352cbf4eddd71f279c4b3103f9ade0
https://hal.archives-ouvertes.fr/hal-01696197

Study on aluminium reconstruction and bond wire lift-off effects on current density distribution in power semiconductor dies

Autor: Nguyen, Tien Anh, Labrousse, Denis, Joubert, Pierre-Yves, Lefebvre, Stéphane, Bontemps, Serge

Publikováno v: PCIM Europe 2013
PCIM Europe 2013, May 2013, Nuremberg, Germany

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::4ca4324cf4afc793632a9e6b59bcb0ce
https://hal.archives-ouvertes.fr/hal-01696201

Investigations on ageing of IGBT transistors under repetitive short-circuits operations

Autor: Berkani, Mounira, Lefebvre, Stéphane, Khatir, Zoubir, Bontemps, Serge

Publikováno v: 8th International PCIM China Conference
International Conference & Exhibition on Power Electronics/Intelligent Motion/Power Quality
International Conference & Exhibition on Power Electronics/Intelligent Motion/Power Quality, Jun 2009, Shanghai, China. pp.237-242

International audience; In this paper, we describe experimental results concerning the ageing of 600 V IGBT under repetitive short circuit conditions. A critical energy, which is dependent on test conditions, has been already pointed out which separa

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5ac66d032cc5a88951b2b25a53b0ac89
https://hal.archives-ouvertes.fr/hal-00538554