Zobrazeno 1 - 10
of 123
pro vyhledávání: '"Bonggeun, Shong"'
Publikováno v:
Journal of Science: Advanced Materials and Devices, Vol 9, Iss 3, Pp 100754- (2024)
Dimethylaluminum isopropoxide (DMAI) is attracting attention as an alternative precursor for atomic layer deposition (ALD) of aluminum oxide (Al2O3). However, the surface chemical reaction mechanisms of DMAI during ALD regarding its dimeric structure
Externí odkaz:
https://doaj.org/article/3980f09f1de3432198be6b81f1558802
Autor:
Hyobin Eom, Woojin Bae, Ju Young Sung, Ji Hyeon Choi, Kyun Seong Dae, Jae Hyuck Jang, Tae Joo Park, Sang Woon Lee, Bonggeun Shong
Publikováno v:
APL Materials, Vol 12, Iss 3, Pp 031115-031115-8 (2024)
The two-dimensional electron gas (2DEG) is a group of electrons that can move freely in horizontal dimensions but are confined in the third direction. It has been reported that atomic layer deposition (ALD) of Al2O3 on various reducible n-type oxides
Externí odkaz:
https://doaj.org/article/3a2dea0ba4b84e3589d096869fc6cdfb
Publikováno v:
Advanced Electronic Materials, Vol 10, Iss 3, Pp n/a-n/a (2024)
Abstract Atomic layer deposition (ALD) is utilized for the fabrication of miniaturized electronic devices with nanometer‐scale features. However, the conventional ALD process on high‐aspect‐ratio (HAR) substrates often results in the deposition
Externí odkaz:
https://doaj.org/article/9c811118807842028b3a2cb2d02e3d7c
Autor:
Chi Thang Nguyen, Eun-Hyoung Cho, Bonwook Gu, Sunghee Lee, Hae-Sung Kim, Jeongwoo Park, Neung-Kyung Yu, Sangwoo Shin, Bonggeun Shong, Jeong Yub Lee, Han-Bo-Ram Lee
Publikováno v:
Nature Communications, Vol 13, Iss 1, Pp 1-10 (2022)
Integrating bottom-up and top-down fabrication techniques can overcome limits in nanofabrication. Here authors demonstrate an approach for area selective deposition using Ti as an inhibitor in the atomic layer deposition process to achieve controlled
Externí odkaz:
https://doaj.org/article/171a10ef297d4e4a911dbd77a990b845
Autor:
Chi Thang Nguyen, Eun-Hyoung Cho, Bonwook Gu, Sunghee Lee, Hae-Sung Kim, Jeongwoo Park, Neung-Kyung Yu, Sangwoo Shin, Bonggeun Shong, Jeong Yub Lee, Han-Bo-Ram Lee
Publikováno v:
Nature Communications, Vol 14, Iss 1, Pp 1-1 (2023)
Externí odkaz:
https://doaj.org/article/53f42571871a4952ab2204de9adcf668
Autor:
Jeongwoo Park, Hyobin Eom, Seong Hwan Kim, Tae Jun Seok, Tae Joo Park, Sang Woon Lee, Bonggeun Shong
Publikováno v:
Materials Today Advances, Vol 12, Iss , Pp 100195- (2021)
Two-dimensional electron gases (2DEGs) localized at oxide heterointerfaces can potentially be used in applications associated with the design of novel electronic device architectures. Recent studies have reported that atomic layer deposition (ALD) of
Externí odkaz:
https://doaj.org/article/9bfadf3005aa462e9017f747f2c3be09
Publikováno v:
Chemistry of Materials. 35:4100-4108
Autor:
Hye-In Yeom, Jingyu Kim, Guk-Jin Jeon, Jeongwoo Park, Dong Uk Han, Joohyeong Kim, Kyung Min Kim, Bonggeun Shong, Sang-Hee Ko Park
Publikováno v:
Journal of Materials Chemistry C. 11:1336-1345
With in-depth analysis and the exact conduction mechanism, the oxide thin-film diodes were developed by ALD-assisted interface engineering.
Autor:
Neung-Kyung Yu, Kyungjun Kim, Changhoon Heo, Jinhee Lee, Wonyeob Kim, Sung-Woong Chung, Bonggeun Shong
Publikováno v:
Silicon. 15:3193-3199
Publikováno v:
ACS Sustainable Chemistry & Engineering. 10:17261-17273