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pro vyhledávání: '"Bong-Kwon Na"'
Publikováno v:
Journal of the Korean institute of surface engineering. 46:145-152
The growth behavior of nanocrystalline diamond (NCD) film has been studied for three different substrates, i.e. bare Si wafer, 1 thick W and Ti films deposited on Si wafer by DC sputter. The surface roughness values of the substrates measured by AFM
Autor:
Chan Hyoung Kang, Bong-Kwon Na
Publikováno v:
Journal of the Korean institute of surface engineering. 46:68-74
For the coating of diamond films on WC-Co tools, a buffer interlayer is needed because Co catalyzes diamond into graphite. W and Ti were chosen as candidate interlayer materials to prevent the diffusion of Co during diamond deposition. W or Ti interl