Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Bon Young Koo"'
Publikováno v:
Korean Journal of Legal Medicine. 44:76-83
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b592038434fb995aaac869feb8f75b3a
https://doi.org/10.7580/kjlm.2020.44.2.76
https://doi.org/10.7580/kjlm.2020.44.2.76
Autor:
Bon-young Koo
Publikováno v:
Journal of Communication Design. 69:87-98
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e3f31dd090d5d2e0d6650ddcb2bd0db0
https://doi.org/10.25111/jcd.2019.69.07
https://doi.org/10.25111/jcd.2019.69.07
Autor:
Jae Hyun Kim, Sunnu Shim, Bon-young Koo, Wonse Kim, Wookhyun Cho, Ki-Soo Lee, Gwang Wook Lee, Seongjun Cho, Seok-jun Won
Publikováno v:
Microelectronics Reliability. 114:113874
Failure Analysis (FA) on Fully Depleted Silicon on Insulator (FDSOI) device is challenging due to its unique structure with buried oxide layer. Typical failure analyses for the bulk device are not viable to isolate the fault location as the first ste
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27b854f20402550ae2fac4cd1bce0ea5
https://doi.org/10.1016/j.microrel.2020.113874
https://doi.org/10.1016/j.microrel.2020.113874
Publikováno v:
Journal of the Korean earth science society. 35:131-146
Multi-beam echosounder data and grain size analysis data of surface sediment were acquired and analyzed in order to investigate the shelf-to-slope morphology, geological character, and their geological controlling factors in the southwestern margin o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f67bd52d4db66d345a01f1843534292
https://doi.org/10.5467/jkess.2014.35.2.131
https://doi.org/10.5467/jkess.2014.35.2.131
Publikováno v:
Journal of the Korean Society of Marine Engineering. 31:531-542
Simultaneous measurement technique for temperature and velocity fields near a heated solid body has been constructed. The measurement system consists of a 3 plate CCD color camera, a color image grabber, a lighting system, a host computer and a softw
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0ddd8a80cfb3d9eb9a38a88f7022e1f5
https://doi.org/10.5916/jkosme.2007.31.5.531
https://doi.org/10.5916/jkosme.2007.31.5.531
Autor:
Bon-young Koo, Jae-Young Ahn, Sang-Ryol Yang, Sungkweon Baek, Si-Young Choi, Chang-Jin Kang, Ki-Hyun Hwang, Joo-Tae Moon
Publikováno v:
2010 IEEE International Memory Workshop.
We suggested the heterogeneously stacked oxide (HSO) for the future tunnel oxide of high density NAND flash memory. HSO has a structure of SiO 2 /a-Si/a-SiOx using the concept of tunnel barrier engineering. By employing HSO tunnel barrier, it was pos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4fd70efc13e3250d843b499b0800c826
https://doi.org/10.1109/imw.2010.5488330
https://doi.org/10.1109/imw.2010.5488330
Publikováno v:
2010 IEEE International Memory Workshop.
The improvement of device performances has been achieved successfully through OAO IPD EOT scaling, which shows that OAO IPD is applicable to sub-40nm devices which require aggressive scaling of IPD EOT. Charge loss of OAO IPD at high temperature is e
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06bc29dc8d2a52374a57d568ebca3b96
https://doi.org/10.1109/imw.2010.5488413
https://doi.org/10.1109/imw.2010.5488413
Autor:
Si-Young Choi, Sunjung Kim, Joon-Gon Lee, Seung Jae Baik, Bio Kim, Bon-young Koo, Joo-Tae Moon
Publikováno v:
2009 IEEE International Reliability Physics Symposium.
We investigated threshold voltage shifts after program pulse in charge trap flash memory by measuring drain current changes. We have found threshold voltage shifts can be characterized as a function of not only the materials of tunnel oxide, trap lay
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2b960df211159a87ad1b8d170b57fe74
https://doi.org/10.1109/irps.2009.5173265
https://doi.org/10.1109/irps.2009.5173265
Autor:
Joo-Tae Moon, U-In Chung, Dae Won Moon, Dong Chan Kim, Chul-Sung Kim, Yu-gyun Shin, Mann Ho Cho, Bon-young Koo, Sungkweon Baek, Kwun-Bum Chung, Ji-Hyun Kim, Jin-Hwa Heo, Young-Jin Noh
Publikováno v:
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..
We reduced the gate tunneling current by seven times and suppressed NBTI using plasma nitridation-induced re-oxidation (PIROX). In plasma nitrided gate oxynitride, the nitrogen concentration at the MOS interface is determined after plasma nitridation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f74ad5e645bef85a4cae4fe9cb995cac
https://doi.org/10.1109/essder.2005.1546621
https://doi.org/10.1109/essder.2005.1546621
Publikováno v:
Journal of Breast Cancer. 12:100
Purpose: This study was performed to find the adequate number of removed lymph nodes to achieve an acceptable false-negative rate when performing sentinel lymph node biopsy for breast cancer. Methods: A total of 179 sentinel node biopsies combined wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::50b6ceecb910f053fa1391c4520d6d11
https://doi.org/10.4048/jbc.2009.12.2.100
https://doi.org/10.4048/jbc.2009.12.2.100