Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Boef, A. den"'
Structural dynamics models with nonlinear stiffness appear, for example, when analyzing systems with nonlinear material behavior or undergoing large deformations. For complex systems, these models become too large for real-time applications or multi-
Externí odkaz:
http://arxiv.org/abs/2407.21672
Many relevant problems in the area of systems and control, such as controller synthesis, observer design and model reduction, can be viewed as optimization problems involving dynamical systems: for instance, maximizing performance in the synthesis se
Externí odkaz:
http://arxiv.org/abs/2311.08115
Node classification utilizing text-based node attributes has many real-world applications, ranging from prediction of paper topics in academic citation graphs to classification of user characteristics in social media networks. State-of-the-art node c
Externí odkaz:
http://arxiv.org/abs/2208.04609
This paper describes the LPVcore software package for MATLAB developed to model, simulate, estimate and control systems via linear parameter-varying (LPV) input-output (IO), state-space (SS) and linear fractional (LFR) representations. In the LPVcore
Externí odkaz:
http://arxiv.org/abs/2105.03695
Publikováno v:
In IFAC PapersOnLine 2019 52(28):20-25
Publikováno v:
Operations Research, 2005 Jul 01. 53(4), 735-736.
Externí odkaz:
https://www.jstor.org/stable/25146907
Autor:
Kuiper, S., Fritz, E.C., Crowcombe, W.E., Liebig, T., Kramer, G.F.I., Witvoet, G., Duivenvoorde, T., Overtoom, A.J., Rijnbeek, R.A., Zwet, E.J. van, Dijsseldonk, A. van, Boef, A. den, Beems, M., Levasier, L.
Publikováno v:
Sanchez, M.I.Ukraintsev, V.A., 30th Conference on Metrology, Inspection, and Process Control for Microlithography, 22-25 February 2016, 9778
Nowadays most overlay metrology tools assess the overlay performance based on marker features which are deposited next to the functional device features within each layer of the semiconductor device. However, correct overlay of the relatively coarse
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::11a6679a4969054dbfbc01c4cb269935
http://resolver.tudelft.nl/uuid:37309d0e-df8b-4a85-bc03-d598d1d498a5
http://resolver.tudelft.nl/uuid:37309d0e-df8b-4a85-bc03-d598d1d498a5
Autor:
Boef, E. den, Hertog, D. den
In this paper we propose two new line search methods for convex functions. These new methods exploit the convexity property of the function, contrary to existing methods.The worst method is an improved version of the golden section method.For the sec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______645::cbb21fdff2fd81b7dfc07b55a5f85f10
http://arno.uvt.nl/show.cgi?fid=10560
http://arno.uvt.nl/show.cgi?fid=10560
Autor:
Tjoa, G L, Boef, R den
Publikováno v:
Journal of Physics E: Scientific Instruments; 1986, Vol. 19 Issue 11, p907-910, 4p
Publikováno v:
International Journal of Environmental Analytical Chemistry; Aug1990, Vol. 39 Issue 4, p391-400, 10p