Zobrazeno 1 - 10
of 379
pro vyhledávání: '"Bodermann Bernd"'
Autor:
Grundmann Jana, Bodermann Bernd
Publikováno v:
EPJ Web of Conferences, Vol 309, p 02010 (2024)
An imaging Mueller matrix ellipsometer is used to measure structures in measuring fields in the micrometre range, which are too small for conventional ellipsometry. Line and grid structures are measured and evaluated with the help of numerical simula
Externí odkaz:
https://doaj.org/article/0a09a7a53e00478f91ed029453b2ea16
Publikováno v:
EPJ Web of Conferences, Vol 309, p 02013 (2024)
We investigate diamond nitrogen-vacancy (NV) centers as alternative labels in stimulated emission depletion (STED) microscopy. To this end, artificial diamond is used as a substrate and Raman spectroscopy in photoluminescence (PL) mode is performed f
Externí odkaz:
https://doaj.org/article/6602e7dedca1459aac83764dfde2e8bc
Autor:
Käseberg Tim, Bodermann Bernd, Sturm Matthias, Wurm Matthias, Siefke Thomas, Siaudinyté Lauryna, Tranum Rømer Astrid, Hansen Poul-Erik
Publikováno v:
EPJ Web of Conferences, Vol 309, p 02005 (2024)
In the pursuit of closing the gap between nanometrology and nanofabrication, we investigate the use of advanced optical far field methods for sub-wavelength parameter reconstruction. With the goal of establishing a hybrid evaluation scheme connecting
Externí odkaz:
https://doaj.org/article/09dfd965ddfb43338a5864e1423e7491
Autor:
Mukherjee Deshabrato, Burger Sven, Siefke Thomas, Gour Jeetendra, Bodermann Bernd, Petrik Peter
Publikováno v:
EPJ Web of Conferences, Vol 309, p 02016 (2024)
Gold gratings were measured by spectroscopic ellipsometry and modeled by the finite element method to investigate the capabilities of optical dimensional metrology for plasmonic diffractive structures. The gratings were prepared by electron beam lith
Externí odkaz:
https://doaj.org/article/16186d4d1f5f4d8fb34ed36e506912d9
Autor:
Asadova, Nigar, Achouri, Karim, Arjas, Kristian, Auguié, Baptiste, Aydin, Roland, Baron, Alexandre, Beutel, Dominik, Bodermann, Bernd, Boussaoud, Kaoutar, Burger, Sven, Choi, Minseok, Czajkowski, Krzysztof M., Evlyukhin, Andrey B., Fazel-Najafabadi, Atefeh, Fernandez-Corbaton, Ivan, Garg, Puneet, Globosits, David, Hohenester, Ulrich, Kim, Hongyoon, Kim, Seokwoo, Lalanne, Philippe, Ru, Eric C. Le, Meyer, Jörg, Mun, Jungho, Pattelli, Lorenzo, Pflug, Lukas, Rockstuhl, Carsten, Rho, Junsuk, Rotter, Stefan, Stout, Brian, Törmä, Päivi, Trigo, Jorge Olmos, Tristram, Frank, Tsitsas, Nikolaos L., Vallée, Renaud, Vynck, Kevin, Weiss, Thomas, Wiecha, Peter, Wriedt, Thomas, Yannopapas, Vassilios, Yurkin, Maxim A., Zouros, Grigorios P.
The transition matrix, frequently abbreviated as T-matrix, contains the complete information in a linear approximation of how a spatially localized object scatters an incident field. The T-matrix is used to study the scattering response of an isolate
Externí odkaz:
http://arxiv.org/abs/2408.10727
Autor:
Krüger Jan, Bergmann Detlef, Sturm Matthias, Häßler-Grohne Wolfgang, Köning Rainer, Bodermann Bernd
Publikováno v:
EPJ Web of Conferences, Vol 266, p 10009 (2022)
We report a custom microscope setup whose mechanical and optical components are adjusted by the means of an alignment autocollimator (AAC). Residual centring and angular misalignments of the components towards the microscope’s optical axis are belo
Externí odkaz:
https://doaj.org/article/1dd650603fd74de08ec78f670aff9474
Publikováno v:
EPJ Web of Conferences, Vol 266, p 10003 (2022)
Nanowire structures arranged in a hexagonal lattice are to be characterized in terms of their diameter, height and pitch. A scatterometer and an imaging Mueller matrix ellipsometer, which is a combination of a commercial Mueller matrix ellipsometer a
Externí odkaz:
https://doaj.org/article/7b14c5ef4208413ea3b806d2b4ca386c
Autor:
Manley Phillip, Krüger Jan, Zschiedrich Lin, Hammerschmidt Martin, Bodermann Bernd, Köning Rainer, Schneider Philipp-Immanuel
Publikováno v:
EPJ Web of Conferences, Vol 266, p 10010 (2022)
Dimensional microscopy is an essential tool for non-destructive and fast inspection of manufacturing processes. Standard approaches process only the measured images. By modelling the imaged structure and solving an inverse problem, the uncertainty on
Externí odkaz:
https://doaj.org/article/c4ceae9e8ee946f2880d17bcc8f3aaaf
Publikováno v:
EPJ Web of Conferences, Vol 266, p 10007 (2022)
We realized an imaging Mueller matrix microscope for nanostructure characterization. For investigations on nanoform characterization via Mueller matrix images, we measured and simulated Mueller matrix images of specially designed nanostructures. As a
Externí odkaz:
https://doaj.org/article/d756ebb9533a4fc6994eddda09f973f3
Publikováno v:
EPJ Web of Conferences, Vol 238, p 06006 (2020)
We designed, realized, and characterised an imaging Mueller matrix ellipsometry setup for the pixelwise measurement of the Mueller matrices in microscope images. Our setup is capable of performing measurements in reflection as well as in transmission
Externí odkaz:
https://doaj.org/article/959ae206a0844629b9280acf4b96bb26