Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Bobby Hawkins"'
Autor:
Jonathan Cruel, David Q. Kelly, Jim A. Tatum, Alirio Melgar, Hao Chen, Luke A. Graham, James K. Guenter, Bobby Hawthorne, Bobby Hawkins, Mario Martinez, E. Shaw
Publikováno v:
SPIE Proceedings.
Finisar has developed a line of high power, high efficiency VCSEL arrays. They are fabricated at 860nm as traditional P side up top emitting devices, leveraging Finisar’s existing VCSEL fab and test processes for low cost, high volume capability. A
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::015eba8b65e5b2424df837eea845b455
https://doi.org/10.1117/12.2080064
https://doi.org/10.1117/12.2080064
Publikováno v:
OFC
The next individual-channel VCSEL (Vertical Cavity Surface Emitting Laser) node for data communications is 25 Gbps or higher. Providing the required reliability becomes ever more challenging as the speeds increase, but possible with proper design.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0fe078d90c9cd4c361b9b6dfb0b3e172
https://doi.org/10.1364/ofc.2014.m3g.2
https://doi.org/10.1364/ofc.2014.m3g.2
Autor:
Ralph H. Johnson, Bobby Hawkins, Jim A. Tatum, Luke A. Graham, Gary Landry, Robert A. Hawthorne, James K. Guenter
Publikováno v:
SPIE Proceedings.
For nearly twenty years most models of VCSEL wearout reliability have incorporated Arrhenius activation energy near 0.7 eV, usually with a modest current exponent in addition. As VCSEL production extends into more wavelength, power, and speed regimes
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21d3a36254a541477aded77807164c25
https://doi.org/10.1117/12.2002840
https://doi.org/10.1117/12.2002840
Autor:
Ralph H. Johnson, Bobby Hawkins, Timo Gray, Hao Chen, D. Gazula, Luke A. Graham, Gary Landry, Andrew N. MacInnes, James K. Guenter, Chris Kocot, Jim A. Tatum
Publikováno v:
SPIE Proceedings.
Commercial demand for optical transceivers operating at 14Gbps is now a reality. It is further expected that communications standards utilizing 850nm VCSELs at speeds up to 28Gbps will be ratified in the near future. We report on the development and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c8ba0edb00e579945bdb591db7b8aa5a
https://doi.org/10.1117/12.910505
https://doi.org/10.1117/12.910505
Publikováno v:
Vertical-Cavity Surface-Emitting Lasers XV.
It has been traditional in discussions of VCSEL reliability to consider it as having a single major wearout component, with known temperature and current acceleration. Beyond this major component all other causes of failure are lumped into a small ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9306357feb27b40797e29385264a1df
https://doi.org/10.1117/12.879744
https://doi.org/10.1117/12.879744
Autor:
Gary Landry, Robert A. Hawthorne, Kent Wade, Bobby Hawkins, Ralph H. Johnson, James K. Guenter
Publikováno v:
Vertical-Cavity Surface-Emitting Lasers XIII.
In this paper we describe progress in moving VCSELs toward production-ready status in several applications, among others including substantially higher modulation speeds (14-25 Gbps, or even higher) than in current production. In addition we describe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::47d4b995c11a1cd0c3d63fb5eeeb55c0
https://doi.org/10.1117/12.816809
https://doi.org/10.1117/12.816809
Publikováno v:
SPIE Proceedings.
In 2007 Finisar® completed the transfer of an entire epitaxial and fabrication line from one facility to another. During this period, reliability models had to be re-validated and product continuity maintained. In this paper we describe the activiti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a0cf93125a645c5314919730c6c42489
https://doi.org/10.1117/12.771311
https://doi.org/10.1117/12.771311
Autor:
David T. Mathes, Christopher William Johnson, Bobby Hawkins, Bobby Hawthorne, Jim A. Tatum, J.K. Guenter, Ralph H. Johnson
Publikováno v:
SPIE Proceedings.
After some thirty years of materials analyses into the failure behavior of III-V semiconductor lasers, manufacturers of these devices still regularly encounter new failure mechanisms. This is due mainly to the implementation of progressively more com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::525125cc37e237d88488bdeb35a06695
https://doi.org/10.1117/12.646447
https://doi.org/10.1117/12.646447
Autor:
Bobby Hawkins, Ralph H. Johnson, Robert A. Hawthorne, James K. Guenter, Jim A. Tatum, David T. Mathes
Publikováno v:
SPIE Proceedings.
During a year of substantial consolidation in the VCSEL industry, Honeywell sold their VCSEL Optical Products Division, which has now officially changed its name to Advanced Optical Components (AOC). Both manufacture and applied research continue, ho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::237c845ae89464e59ef06d0ca85c4078
https://doi.org/10.1117/12.601831
https://doi.org/10.1117/12.601831
Publikováno v:
SPIE Proceedings.
Honeywell continues to be the world’s leading supplier of VCSELs operating at 850 nm. This paper will cover new commercial application areas for 850-nm VCSELs, and will present new findings in VCSEL reliability science. In particular, newly-develop
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8edf6e821e47133ed805f02693f717f8
https://doi.org/10.1117/12.540129
https://doi.org/10.1117/12.540129