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pro vyhledávání: '"Bob Kurtz"'
Publikováno v:
Proceedings of the 44th International Conference on Software Engineering.
Publikováno v:
ICSE (Companion Volume)
This paper addresses two long-standing goals in software testing: making mutation-based testing practical and software testing overall more effective, predictable, and consistent. To that end, this paper proposes a novel mutation-based approach that
Publikováno v:
ICST Workshops
Mutation analysis evaluates a testing or debugging technique by measuring how well it detects mutants, which are systematically seeded, artificial faults. Mutation analysis is inherently expensive due to the large number of mutants it generates and d
Publikováno v:
ISSTA
Existing mutation techniques produce vast numbers of equivalent, trivial, and redundant mutants. Selective mutation strategies aim to reduce the inherent redundancy of full mutation analysis to obtain most of its benefit for a fraction of the cost. U
Publikováno v:
SIGSOFT FSE
24th ACM SIGSOFT International Symposium on Foundations of Software Engineering (FSE) - NOV 13-18, 2016 - Seattle, WA WOS: 000391133400053 Various forms of selective mutation testing have long been accepted as valid approximations to full mutation te
Autor:
Bob Kurtz
Publikováno v:
SIGSOFT FSE
Mutation testing has been shown to support the generation of test sets that are highly effective at detecting faults. However, practitioner adoption of mutation testing has been minimal in part because of problems that arise from the huge numbers of
Publikováno v:
ICST Workshops
Mutation score has long been used in research as a metric to measure the effectiveness of testing strategies. This paper presents evidence that mutation score lacks the desired accuracy to determine the completeness of a test suite due to noise intro
Publikováno v:
ICST Workshops
Mutation testing researchers have long known that many generated mutants are not needed. This paper develops a graph model to describe redundancy among mutations. We define "true" subsumption, a relation that practicing test engineers would like to h