Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Bo-Mook Chung"'
Publikováno v:
Journal of Alloys and Compounds. 579:75-81
We examined the effects of layers of intermetallic compound (IMC) Ni 3 Sn 4 and (Cu,Ni) 6 Sn 5 formed at the solder/Ni interface, on the cross-interactions between Pd and Ni during solid-state aging and reflow soldering. Two types of diffusion couple
Publikováno v:
Electrochimica Acta. 106:333-341
a b s t r a c t In order to gain further insight into the formation mechanism of fire-through Ag contacts of Si solar cells, the ionization of Ag during the dissolution of Ag powder into a lead borosilicate glass melt was electrochemically investigat
Publikováno v:
Journal of Electronic Materials. 41:3348-3358
The microstructural evolution between Sn-3Ag-0.5Cu (SAC305) solder and Ni(P)/Pd(P)/Au finish during the reflow process was investigated for various Pd(P) thicknesses (0 μm to 0.6 μm). The reflow process was carried out in a belt-conveying reflow ov
Publikováno v:
Journal of Electronic Materials. 41:44-52
To simulate the growth of Ni3Sn4 phase layers in Sn-based solder joints with Ni substrates during solid-state aging, Sn/(Cu1−x Ni x )6Sn5/Ni and Sn/Ni diffusion couples were aged isothermally at 180°C and 200°C, and the growth kinetics of the (Ni
Publikováno v:
Korean Journal of Metals and Materials. 48:1041-1046
The reactions between a Sn-3.0Ag-0.5Cu solder alloy and electroless Ni/electroless Pd/immersion Au (ENEPIG) surface finishes with various Pd layer thicknesses (0, 0.05, 0.1, 0.2, 0.4 μm) were examined for the effect of the Pd layer on the massive sp
Publikováno v:
Metals and Materials International. 15:487-492
The interaction between Cu6Sn5 particles in the bulk of a solder and a Ni substrate was examined during solid-state aging using Cu/Sn/Ni and Cu/Sn/Cu/Sn/Ni diffusion couples with initially thin Cu layers. The results clearly demonstrated that the (Cu
Publikováno v:
2009 34th IEEE Photovoltaic Specialists Conference (PVSC); 2009, p000766-000769, 4p